المؤلفون: Usami, R., Kobashi, Y., Onuma, T., Maekawa, T.

المصدر: IEEE Transactions on Intelligent Vehicles IEEE Trans. Intell. Veh. Intelligent Vehicles, IEEE Transactions on. 5(2):281-293 Jun, 2020

المؤلفون: Inoue, S., Sadao, K., Ozawa, T., Kobashi, Y., Kawai, H., Kitagawa, T., Shimoda, T.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :197-200 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM