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المؤلفون: La Spina, L.
المساهمون: Nanver, L.K.
المصدر: None
مصطلحات موضوعية: safe operating area, thermal coupling, thermal instability, thermal resistance, self-heating, ballasting resistor, electrothermal effects, aluminum nitride (AlN), heterojunction bipolar transistor (HBT), bipolar junction transistor (BJT), silicon-on-glass (SOG), multifinger device, heatspreaders, mutual thermal resistance
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::4ff70aab5d0b4d55742ace1e6c12a30b
http://resolver.tudelft.nl/uuid:76a2ded0-b96a-402d-a23c-db6ee4ff52b2