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المؤلفون: A. Ferre, J. Figueras
المصدر: ICECS
مصطلحات موضوعية: Standard cell, Leak, Materials science, Subthreshold conduction, business.industry, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Leakage power, law.invention, CMOS, law, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Hardware_LOGICDESIGN, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0ba4a131eda7ae523ac5807708abd034
https://doi.org/10.1109/icecs.1998.814859