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المؤلفون: Dondee Navarro, Hans Jurgen Mattausch, Masataka Miyake, Norio Sadachika, S. Kumashiro, M. Miura-Mattausch, Takahiro Iizuka, T. Ezaki, M. Taguchi, S. Miyamoto, Tatsuya Ohguro, T. Warabino
المصدر: 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.
مصطلحات موضوعية: Noise temperature, Noise generator, business.industry, Computer science, MOSFET, Electrical engineering, Electronic engineering, Shot noise, Y-factor, Flicker noise, business, Low-noise amplifier, Noise (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::60b36b643754aba3609e51a5a27d47ff
https://doi.org/10.1109/icsict.2006.306109