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المؤلفون: Nagarajan Raghavan, Michel Bosman, K. L. Pey, K. Shubhakar, S. Mei
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Materials science, Multiphysics, Nucleation, 02 engineering and technology, Mechanics, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Finite element method, Stack (abstract data type), Percolation, 0103 physical sciences, Electronic engineering, Grain boundary, Kinetic Monte Carlo, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b1a6515e799f25f642fb0ea5a7a63f4e
https://doi.org/10.1109/irps.2016.7574574 -
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المؤلفون: A. Ranjan, Sean J. O’Shea, Nagarajan Raghavan, Michel Bosman, Kin Leong Pey, Joel Molina, K. Shubhakar, R. Thamankar
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Triple point, Analytical chemistry, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Percolation, Metastability, Vacancy defect, 0103 physical sciences, Breakdown voltage, Grain boundary, 0210 nano-technology, Spectroscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9fbc49463aaf71fa6b8fe27609bc5848
https://doi.org/10.1109/irps.2016.7574576