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المؤلفون: S. Carey, Christos Vezrytzis, Anthony Saporito, Pierce Chuang, Alper Buyuktosunoglu, Phillip J. Restle, Tobias Webel, Christian Jacobi, Preetham M. Lobo, Hunter Shi, Christopher J. Berry, David H. Wolpert, Dureseti Chidambarrao, Ramon Bertran, Thomas Strach, Pawel Owczarczyk, Yaniv Maroz, Richard F. Rizzolo
المصدر: IEEE Journal of Solid-State Circuits. 54:121-132
مصطلحات موضوعية: Power management, Reliability (semiconductor), Built-in self-test, Computer science, 020208 electrical & electronic engineering, Scalability, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Electrical and Electronic Engineering, IBM, Critical path method, Reliability engineering