-
1
المؤلفون: Luca P. Carloni, Paolo Mantovani, Davide Giri, Kuan-Lin Chiu, Guy Eichler
المصدر: IEEE Micro. 41:8-14
مصطلحات موضوعية: Multi-core processor, business.industry, Computer science, Deep learning, Design flow, 02 engineering and technology, 020202 computer hardware & architecture, Task (computing), Open source, Hardware and Architecture, Embedded system, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, System integration, Artificial intelligence, Electrical and Electronic Engineering, business, Field-programmable gate array, Software, Agile software development
-
2
المؤلفون: Joseph McMahan, Jared Roesch, Luis Ceze, Luis Vega
المصدر: IEEE Micro. 40:103-111
مصطلحات موضوعية: Adder, Computer science, business.industry, Interface (computing), 02 engineering and technology, 020202 computer hardware & architecture, Software, Hardware and Architecture, 0202 electrical engineering, electronic engineering, information engineering, Verilog, System integration, Electrical and Electronic Engineering, business, computer, Computer hardware, computer.programming_language, Register-transfer level
-
3
المؤلفون: Ye-Sheng Kuo, Zhiyoong Foo, David Blaauw, Ronald G. Dreslinski, Prabal Dutta, Gyouho Kim, Yoonmyung Lee, Pat Pannuto, Benjamin Kempke
المصدر: IEEE Micro. 36:60-70
مصطلحات موضوعية: Power management, Power gating, Computer science, Overhead (engineering), 02 engineering and technology, 01 natural sciences, law.invention, MBus, law, Low-power electronics, 0103 physical sciences, Chip select, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Electronic circuit, 010302 applied physics, business.industry, 020208 electrical & electronic engineering, Modular design, Microarchitecture, Hardware and Architecture, Logic gate, Embedded system, System integration, Resistor, business, Software
-
4
المؤلفون: Robert P. Dick, Russ Joseph, Li Shang, David Brooks
المصدر: IEEE Micro. 27:49-62
مصطلحات موضوعية: Battery (electricity), business.industry, Computer science, Energy consumption, Circuit reliability, Reliability engineering, Power (physics), law.invention, Microprocessor, Reliability (semiconductor), Hardware and Architecture, law, Embedded system, Low-power electronics, System integration, Electrical and Electronic Engineering, business, Software
-
5
المؤلفون: K.D. Economides, M.A. Tsoukarellas, Vassilis C. Gerogiannis
المصدر: IEEE Micro. 15:50-60
مصطلحات موضوعية: Test strategy, Ad hoc testing, Computer science, Integration testing, White-box testing, Functional testing, System testing, Software requirements specification, Software performance testing, Black-box testing, Embedded operating system, Software, Acceptance testing, Formal specification, Software quality analyst, Software verification and validation, Electrical and Electronic Engineering, business.industry, Reliability engineering, Hardware and Architecture, Non-regression testing, Embedded system, Software construction, Operational acceptance testing, Software reliability testing, business, Conformance testing, Quality assurance, System integration testing
-
6
المؤلفون: H.K.N. Leung, L. White
المصدر: IEEE Micro. 12:81-84
مصطلحات موضوعية: Test strategy, Integration testing, Computer science, White-box testing, Functional testing, Maintainability, Risk-based testing, System testing, Manual testing, Software performance testing, Keyword-driven testing, Recovery testing, Acceptance testing, Regression testing, Electrical and Electronic Engineering, Software regression, Testability, business.industry, Software development, Software maintenance, Reliability engineering, Hardware and Architecture, Non-regression testing, Software construction, Software reliability testing, business, System integration testing, Software, Test data
-
7
المؤلفون: G. Troster
المصدر: IEEE Micro. 18:7-9
مصطلحات موضوعية: business.industry, Computer science, Electronic packaging, Energy consumption, Chip, Electromagnetic interference, Hardware and Architecture, Embedded system, System integration, Integrated circuit packaging, Electrical and Electronic Engineering, Routing (electronic design automation), business, Software
-
8
المؤلفون: Frits van der Linden, Ian Wilson
المصدر: IEEE Micro. 5:18-31
مصطلحات موضوعية: business.industry, Background debug mode interface, Computer science, media_common.quotation_subject, White-box testing, Debug menu, System testing, Software performance testing, Algorithmic program debugging, Software bug, Debugging, Computer architecture, Software_SOFTWAREENGINEERING, Hardware and Architecture, Regression testing, Software construction, Software reliability testing, Electrical and Electronic Engineering, Software engineering, business, System integration testing, Nexus (standard), Software, media_common, Real-time testing