المؤلفون: Zou, Y., Zhang, X., Li, Y., Wang, B., Yan, H., Cui, J., Liu, L., Da, D.
المصدر: Journal of Materials Science; Mar2002, Vol. 37 Issue 5, p1043-1047, 5p
مصطلحات موضوعية: METAL bonding, CARBON, BORON, THIN films, RADIOFREQUENCY spectroscopy, PLASMA-enhanced chemical vapor deposition, X-ray photoelectron spectroscopy, FOURIER transform infrared spectroscopy