المؤلفون: Anders Hallén, B. G. Svensson, Jennifer Wong-Leung, Patrick Lévêque, H. Kortegaard-Nielsen, Chennupati Jagadish, P. Pellegrino

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 186:334-338

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Deep-level transient spectroscopy, Silicon, Proton, Doping, Analytical chemistry, chemistry.chemical_element, Crystallographic defect, Ion implantation, chemistry, Vacancy defect, Atomic physics, Boron, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b850f76c147ff3fdfab11b18337cbf4
https://doi.org/10.1016/s0168-583x(01)00874-6

المؤلفون: P. Pellegrino, V. Privitera, Anders Hallén, Patrick Lévêque, B. G. Svensson

المصدر: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
186 (2002): 375–379. doi:10.1016/S0168-583X(01)00897-7
info:cnr-pdr/source/autori:Leveque P., Hallen A., Pellegrino P., Svensson B.G., Privitera V./titolo:Dose-rate influence on the defect production in mev proton-implanted float-zone and epitaxial n-type silicon/doi:10.1016%2FS0168-583X(01)00897-7/rivista:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (Print)/anno:2002/pagina_da:375/pagina_a:379/intervallo_pagine:375–379/volume:186

مصطلحات موضوعية: Nuclear and High Energy Physics, silicon, proton-implantation, dose-rate, DLTS, Materials science, Silicon, Proton, Diffusion, Analytical chemistry, chemistry.chemical_element, Epitaxy, Crystallographic defect, Oxygen, chemistry, Limiting oxygen concentration, Irradiation, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::952a014ca1f211fb0dad7e6c8e3199b5
https://doi.org/10.1016/s0168-583x(01)00897-7

المؤلفون: J.S. Christensen, Patrick Lévêque, A. Yu. Kuznetsov, B. G. Svensson, A. Nylandsted Larsen

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 178:337-341

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Silicon, Proton, Diffusion, Doping, Analytical chemistry, chemistry.chemical_element, Crystallographic defect, chemistry, Irradiation, Boron, Instrumentation, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b59a93c5937da5390f8f274ecb90709c
https://doi.org/10.1016/s0168-583x(00)00478-x

المؤلفون: Anders Hallén, P. Pellegrino, B. G. Svensson, V. Privitera, Patrick Lévêque

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 174:297-303

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Deep-level transient spectroscopy, Hydrogen, Silicon, Annealing (metallurgy), chemistry.chemical_element, Epitaxy, Crystallography, Ion implantation, chemistry, Vacancy defect, Irradiation, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e78645b65d0f18c7eb5ebdee7ee96a8
https://doi.org/10.1016/s0168-583x(00)00524-3

المؤلفون: Pierre-Olivier Renault, Patrick Lévêque, Alain Declémy

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 168:40-46

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Scattering, Doping, Infrared reflectivity, Analytical chemistry, chemistry.chemical_element, Free carrier, Fluence, Ion, Ion implantation, chemistry, Aluminium, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6073720db7cd7f39c44698d9c2ef9ba4
https://doi.org/10.1016/s0168-583x(99)00765-x

المؤلفون: Patrick Lévêque, Alain Declémy

المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 147:181-186

مصطلحات موضوعية: Free electron model, Nuclear and High Energy Physics, Range (particle radiation), SIMPLE (dark matter experiment), Ion implantation, Materials science, Analytical chemistry, Infrared spectroscopy, Electron, Instrumentation, Spectral line, Ion

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::855386d518d676a37898365ebac6fa0e
https://doi.org/10.1016/s0168-583x(98)00543-6