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المؤلفون: Lai, Y. -T., Wang, M. -Z., Adachi, I., Aihara, H., Al Said, S., Asner, D. M., Aushev, T., Ayad, R., Badhrees, I., Bakich, A. M., Bansal, V., Barberio, E., Berger, M., Bhardwaj, V., Bhuyan, B., Biswal, J., Bobrov, A., Bozek, A., Bracko, M., Cervenkov, D., Chang, P., Chen, A., Cheon, B. G., Chilikin, K., Chistov, R., Cho, K., Chobanova, V., Choi, Y., Cinabro, D., Dash, N., Di Carlo, S., Dolezal, Z., Dutta, D., Eidelman, S., Epifanov, D., Farhat, H., Fast, J. E., Ferber, T., Fulsom, B. G., Gaur, V., Gabyshev, N., Garmash, A., Gillard, R., Goldenzweig, P., Golob, B., Hayasaka, K., Hou, W. -S., Hsu, C. -L., Iijima, T., Inami, K., Inguglia, G., Ishikawa, A., Itoh, R., Iwasaki, Y., Jacobs, W. W., Jaegle, I., Jeon, H. B., Joffe, D., Joo, K. K., Julius, T., Kang, K. H., Kawasaki, T., Kim, D. Y., Kim, J. B., Kim, K. T., Kim, M. J., Kim, S. H., Kim, Y. J., Kinoshita, K., Kodys, P., Kotchetkov, D., Krokovny, P., Kuhr, T., Kulasiri, R., Kwon, Y. -J., Lange, J. S., Lee, I. S., Li, C. H., Li, L., Li, Y., Gioi, L. Li, Libby, J., Liventsev, D., Masuda, M., Matsuda, T., Matvienko, D., Miyabayashi, K., Miyata, H., Mizuk, R., Mohanty, G. B., Mohanty, S., Nakano, E., Nakao, M., Nakazawa, H., Nanut, T., Nath, K. J., Natkaniec, Z., Nayak, M., Nishida, S., Ogawa, S., Okuno, S., Pakhlov, P., Pal, B., Park, H., Paul, S., Pedlar, T. K., Piilonen, L. E., Pulvermacher, C., Rauch, J., Ritter, M., Sahoo, H., Sakai, Y., Sandilya, S., Sato, Y., Savinov, V., Schlueter, T., Schneider, O., Schnell, G., Schwanda, C., Schwartz, A. J., Seino, Y., Semmler, D., Senyo, K., Seong, I. S., Shebalin, V., Shen, C. P., Shibata, T. -A., Shiu, J. -G., Simon, F., Solovieva, E., Staric, M., Stypula, J., Sumiyoshi, T., Takizawa, M., Tamponi, U., Tenchini, F., Trabelsi, K., Uchida, M., Uehara, S., Uglov, T., Unno, Y., Uno, S., Urquijo, P., Usov, Y., Van Hulse, C., Varner, G., Varvell, K. E., Vorobyev, V., Wang, C. H., Watanabe, M., Watanabe, Y., Widmann, E., Won, E., Yamashita, Y., Ye, H., Yook, Y., Yuan, C. Z., Yusa, Y., Zhang, Z. P., Zhilich, V., Zhulanov, V., Zupanc, A., Belle Collaboration
المصدر: Physical review / D 95(1), 011102 (2017). doi:10.1103/PhysRevD.95.011102
مصطلحات موضوعية: Particle physics, branching ratio: upper limit [D0], charmed particle, FOS: Physical sciences, BELLE, annihilation [electron positron], Upsilon(10870), 01 natural sciences, High Energy Physics - Experiment, law.invention, High Energy Physics - Experiment (hep-ex), KEK-B, KEKB, law, 0103 physical sciences, ddc:530, Limit (mathematics), 010306 general physics, Collider, invisible decay [D0], Particle system, Physics, 010308 nuclear & particles physics, Branching fraction, pair production [D0], Detector, Upsilon(10570), electroproduction [Upsilon(10870)], particle identification [charmed particle], electroproduction [Upsilon(10570)], colliding beams [electron positron], High Energy Physics::Experiment, branching ratio, experimental results
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