المؤلفون: Yuan W; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Zhu B; Interdisciplinary Research Center, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210 China.; Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China., Fang K; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Li XY; Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China.; University of Chinese Academy of Sciences, Beijing, 100049 China., Hansen TW; DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark. yongwang@zju.edu.cn gaoyi@zjlab.org.cn thwh@dtu.dk jabw@dtu.dk., Ou Y; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Yang H; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Wagner JB; DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark. yongwang@zju.edu.cn gaoyi@zjlab.org.cn thwh@dtu.dk jabw@dtu.dk., Gao Y; Interdisciplinary Research Center, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210 China. yongwang@zju.edu.cn gaoyi@zjlab.org.cn thwh@dtu.dk jabw@dtu.dk.; Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China., Wang Y; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China. yongwang@zju.edu.cn gaoyi@zjlab.org.cn thwh@dtu.dk jabw@dtu.dk., Zhang Z; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China.

المصدر: Science (New York, N.Y.) [Science] 2021 Jan 29; Vol. 371 (6528), pp. 517-521.

نوع المنشور: Journal Article; Research Support, Non-U.S. Gov't

بيانات الدورية: Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 0404511 Publication Model: Print Cited Medium: Internet ISSN: 1095-9203 (Electronic) Linking ISSN: 00368075 NLM ISO Abbreviation: Science Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Yuan W; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Zhu B; Division of Interfacial Water and Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China.; Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210 China., Li XY; Division of Interfacial Water and Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China.; University of Chinese Academy of Sciences, Beijing, 100049 China., Hansen TW; DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark., Ou Y; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Fang K; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Yang H; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China., Zhang Z; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China. yongwang@zju.edu.cn gaoyi@zjlab.org.cn jakob.wagner@cen.dtu.dk zezhang@zju.edu.cn., Wagner JB; DTU Nanolab, Technical University of Denmark, DK-2800, Kgs. Lyngby, Denmark. yongwang@zju.edu.cn gaoyi@zjlab.org.cn jakob.wagner@cen.dtu.dk zezhang@zju.edu.cn., Gao Y; Division of Interfacial Water and Key Laboratory of Interfacial Physics and Technology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800 China. yongwang@zju.edu.cn gaoyi@zjlab.org.cn jakob.wagner@cen.dtu.dk zezhang@zju.edu.cn.; Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210 China., Wang Y; State Key Laboratory of Silicon Materials and Center of Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027 China. yongwang@zju.edu.cn gaoyi@zjlab.org.cn jakob.wagner@cen.dtu.dk zezhang@zju.edu.cn.

المصدر: Science (New York, N.Y.) [Science] 2020 Jan 24; Vol. 367 (6476), pp. 428-430.

نوع المنشور: Journal Article; Research Support, Non-U.S. Gov't

بيانات الدورية: Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 0404511 Publication Model: Print Cited Medium: Internet ISSN: 1095-9203 (Electronic) Linking ISSN: 00368075 NLM ISO Abbreviation: Science Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Hansen PL; Haldor Topsøe A/S, Nymøllevej 55, DK-2800 Kgs. Lyngby, Denmark. plh@topsoe.dk, Wagner JB, Helveg S, Rostrup-Nielsen JR, Clausen BS, Topsøe H

المصدر: Science (New York, N.Y.) [Science] 2002 Mar 15; Vol. 295 (5562), pp. 2053-5.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 0404511 Publication Model: Print Cited Medium: Internet ISSN: 1095-9203 (Electronic) Linking ISSN: 00368075 NLM ISO Abbreviation: Science Subsets: PubMed not MEDLINE

المؤلفون: Hansen TW; Haldor Topsøe A/S, Nymøllevej 55, DK-2800 Lyngby, Denmark., Wagner JB, Hansen PL, Dahl S, Topsøe H, Jacobsen CJ

المصدر: Science (New York, N.Y.) [Science] 2001 Nov 16; Vol. 294 (5546), pp. 1508-10.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: American Association for the Advancement of Science Country of Publication: United States NLM ID: 0404511 Publication Model: Print Cited Medium: Print ISSN: 0036-8075 (Print) Linking ISSN: 00368075 NLM ISO Abbreviation: Science Subsets: PubMed not MEDLINE