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1
المؤلفون: M. Mamor, Khalid Bouziane, Malik Maaza
المصدر: Journal of Applied Physics. 126:235707
مصطلحات موضوعية: 010302 applied physics, Materials science, Deep-level transient spectroscopy, Strain (chemistry), Doping, Relaxation (NMR), Enthalpy, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, Crystallographic defect, Tetragonal crystal system, 0103 physical sciences, 0210 nano-technology
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2
المؤلفون: C. T.-K. Lew, Brett C. Johnson, Jeffrey C. McCallum
المصدر: Journal of Applied Physics. 124:125701
مصطلحات موضوعية: Deep-level transient spectroscopy, Annealing (metallurgy), business.industry, General Physics and Astronomy, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Crystallographic defect, Bismuth, Ion, Condensed Matter::Materials Science, Ion implantation, Semiconductor, chemistry, 0103 physical sciences, Electron beam processing, 010306 general physics, 0210 nano-technology, business
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3
المؤلفون: Henk Vrielinck, Federica Gencarelli, Somya Gupta, Johan Lauwaert, Yosuke Shimura, Hugo Bender, Roger Loo, Marc Heyns, Clement Porret, Kristof Paredis, Eddy Simoen
المصدر: APPLIED PHYSICS LETTERS
مصطلحات موضوعية: Materials science, Deep-level transient spectroscopy, Physics and Astronomy (miscellaneous), Band gap, RECOMBINATION, 02 engineering and technology, Substrate (electronics), SEMICONDUCTORS, 01 natural sciences, LAYERS, 0103 physical sciences, HETEROSTRUCTURES, SI, SILICON, 010302 applied physics, Condensed matter physics, business.industry, Doping, 021001 nanoscience & nanotechnology, Crystallographic defect, Semiconductor, Physics and Astronomy, MISFIT DISLOCATIONS, GROWTH, Dislocation, 0210 nano-technology, business, Stacking fault
وصف الملف: application/pdf
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4
المؤلفون: José Coutinho, Anthony R. Peaker, Vladimir P. Markevich
المصدر: Journal of Applied Physics. 123:161559
مصطلحات موضوعية: 010302 applied physics, Materials science, Deep-level transient spectroscopy, business.industry, Semiconductor materials, General Physics and Astronomy, 02 engineering and technology, Semiconductor device, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, Semiconductor, 0103 physical sciences, Optoelectronics, Density functional theory, Charge carrier, 0210 nano-technology, business, Spectroscopy
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5
المؤلفون: Eduard Monakhov, Thomas Neset Sky, Lasse Vines, Alexander Hupfer, F. Herklotz, Christian Zimmermann, Bengt Gunnar Svensson, Julie Bonkerud
المصدر: Journal of Applied Physics. 123:161572
مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, Hydrogen, Band gap, General Physics and Astronomy, Infrared spectroscopy, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, Molecular physics, Condensed Matter::Materials Science, chemistry, Rutile, 0103 physical sciences, Charge carrier, Ionization energy, 010306 general physics, 0210 nano-technology
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المؤلفون: M.J. Legodi, Mmantsae Diale, John W. Rosenberg, Yevgeny Rakita, David Cahen
المصدر: Journal of Applied Physics. 122:145701
مصطلحات موضوعية: Deep-level transient spectroscopy, Laplace transform, Chemistry, Lead bromide, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, 0104 chemical sciences, Power quality, Christian ministry, Atomic physics, Current (fluid), 0210 nano-technology
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7
المؤلفون: S.R. Messenger, Robert J. Walters, G.P. Summers, Jeffrey H. Warner
المصدر: Journal of Applied Physics. 96:7225-7228
مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, General Physics and Astronomy, Activation energy, Electron, Crystallographic defect, Gallium arsenide, Condensed Matter::Materials Science, chemistry.chemical_compound, chemistry, Irradiation, Atomic physics, Diode, Molecular beam epitaxy
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8
المؤلفون: C. H. Fischer, P. Bhattacharya
المصدر: Journal of Applied Physics. 96:4176-4180
مصطلحات موضوعية: Materials science, Deep-level transient spectroscopy, Photoluminescence, business.industry, Analytical chemistry, General Physics and Astronomy, Heterojunction, Epitaxy, Crystallographic defect, Optoelectronics, business, Luminescence, Molecular beam, Molecular beam epitaxy
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9
المؤلفون: Hyung Koun Cho, Chang-Hee Hong, Chang-Dae Kim
المصدر: Journal of Applied Physics. 94:1485-1489
مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, Silicon, business.industry, Doping, Wide-bandgap semiconductor, General Physics and Astronomy, chemistry.chemical_element, Chemical vapor deposition, Crystallographic defect, chemistry, Sapphire, Optoelectronics, Dislocation, business
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المؤلفون: David C. Look, Jang-Hwan Han, Z-Q. Fang, Alexander Y. Polyakov, A. V. Govorkov, N. B. Smirnov, Seong-Ju Park
المصدر: Journal of Applied Physics. 92:5241-5247
مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, Scanning electron microscope, Electron beam-induced current, Analytical chemistry, General Physics and Astronomy, Electron, Electric current, Thin film, Dislocation, Molecular physics, Crystallographic defect