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1
المؤلفون: Kristijan L. Mletschnig, Reinhold Kleiner, Wolfgang Lang, Dieter Koelle, Max Karrer, Bernd Aichner, Johannes D. Pedarnig, B. Müller, Meirzhan Dosmailov
المصدر: Low Temperature Physics. 46:331-337
مصطلحات موضوعية: 010302 applied physics, Superconductivity, Materials science, Physics and Astronomy (miscellaneous), Ion beam, Condensed matter physics, Condensed Matter - Superconductivity, General Physics and Astronomy, 01 natural sciences, Crystallographic defect, Magnetic flux, Magnetic field, Ion implantation, Condensed Matter::Superconductivity, 0103 physical sciences, Thin film, 010306 general physics, Field ion microscope
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2
المؤلفون: Xinfeng Tang, Zhi Li, Sen Xie, Wei Liu, Yu Cao, Ctirad Uher, Cheng Zhang, Junhao Qiu, Hongyao Xie, Min Zhang, Fuqiang Hua
المصدر: Applied Physics Letters. 117:153902
مصطلحات موضوعية: 010302 applied physics, Electron density, Materials science, Physics and Astronomy (miscellaneous), Condensed matter physics, Annealing (metallurgy), Angle-resolved photoemission spectroscopy, 02 engineering and technology, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, Crystallographic defect, X-ray photoelectron spectroscopy, 0103 physical sciences, Thin film, 0210 nano-technology, Molecular beam epitaxy
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3
المؤلفون: Adam Janover, Armando Hernandez, Charles L. Codding, Naresh Adhikari, Mengbing Huang, Farida Selim, Minhazul Islam, Michael Snure, S. Agarwal, Steven W. Novak
المصدر: Journal of Applied Physics. 127:145701
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, technology, industry, and agriculture, General Physics and Astronomy, 02 engineering and technology, Chemical vapor deposition, Electron, Conductivity, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, Acceptor, Semiconductor, 0103 physical sciences, Optoelectronics, Thin film, 0210 nano-technology, business, Luminescence
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المؤلفون: Brenton A. Noesges, Leonard J. Brillson, Kathleen Kash, Jinwoo Hwang, Menglin Zhu, Micah S. Haseman, Daram Ramdin, Walter R. L. Lambrecht, Rezaul Karim, Ella Feinberg, Benthara Hewage Dinushi Jayatunga, Hongping Zhao
المصدر: Journal of Applied Physics. 127:135703
مصطلحات موضوعية: 010302 applied physics, Materials science, Surface photovoltage, General Physics and Astronomy, Cathodoluminescence, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, Condensed Matter::Materials Science, Reciprocal lattice, X-ray photoelectron spectroscopy, Chemical physics, 0103 physical sciences, Density functional theory, Thin film, 0210 nano-technology, Spectroscopy
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5
المؤلفون: Yilei Tian, João Serra, Stephan W. H. Eijt, H. Schut, Takashi Suemasu, Noritaka Usami, Olindo Isabella, R. Gram, Miro Zeman, Ana Montes
المصدر: Journal of Applied Physics, 127(8)
مصطلحات موضوعية: 010302 applied physics, Materials science, Band gap, business.industry, General Physics and Astronomy, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, Positron annihilation spectroscopy, symbols.namesake, Sputtering, 0103 physical sciences, symbols, Optoelectronics, Thin film, 0210 nano-technology, Raman spectroscopy, business, Molecular beam epitaxy, Doppler broadening
وصف الملف: application/pdf
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6
المصدر: Journal of Applied Physics. 123:161558
مصطلحات موضوعية: 010302 applied physics, Solid-state chemistry, Materials science, Open-circuit voltage, Analytical chemistry, General Physics and Astronomy, 02 engineering and technology, Activation energy, 021001 nanoscience & nanotechnology, 01 natural sciences, Crystallographic defect, symbols.namesake, chemistry.chemical_compound, chemistry, 0103 physical sciences, symbols, CZTS, Thin film, 0210 nano-technology, Raman spectroscopy, Stoichiometry
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7
المؤلفون: Gregory Abadias, Y. Y. Tse
المصدر: Journal of Applied Physics. 95:2414-2428
مصطلحات موضوعية: Materials science, General Physics and Astronomy, chemistry.chemical_element, Sputter deposition, Crystallographic defect, Stress (mechanics), Crystallography, Lattice constant, chemistry, Residual stress, Texture (crystalline), Composite material, Thin film, Tin
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8
المؤلفون: David C. Look, Jang-Hwan Han, Z-Q. Fang, Alexander Y. Polyakov, A. V. Govorkov, N. B. Smirnov, Seong-Ju Park
المصدر: Journal of Applied Physics. 92:5241-5247
مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, Scanning electron microscope, Electron beam-induced current, Analytical chemistry, General Physics and Astronomy, Electron, Electric current, Thin film, Dislocation, Molecular physics, Crystallographic defect
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المؤلفون: A. S. Özcan, C. Cabral, Christian Lavoie, R. M. Bradley, Karl F. Ludwig, J. M. E. Harper
المصدر: Journal of Applied Physics. 92:5189-5195
مصطلحات موضوعية: Diffraction, Crystallography, Materials science, Annealing (metallurgy), Chemical physics, Kinetics, X-ray crystallography, Nucleation, General Physics and Astronomy, Thin film, Pole figure, Crystallographic defect
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10
المؤلفون: R. Meaudre, M.E Gueunier, Jean-Paul Kleider, B. Canut, Rudolf Brüggemann, P. Roca i Cabarrocas, S. Lebib
المصدر: Journal of Applied Physics. 92:4959-4967
مصطلحات موضوعية: Materials science, Hydrogen, Annealing (metallurgy), technology, industry, and agriculture, Analytical chemistry, Dangling bond, General Physics and Astronomy, chemistry.chemical_element, Chemical vapor deposition, Crystallographic defect, Silane, chemistry.chemical_compound, chemistry, Germane, Thin film