المؤلفون: C. A. Duţu, Sorin Melinte, Jean-Pierre Raskin, Denis Flandre, Nicolas Reckinger, Alexandru Vlad

المصدر: Applied Physics Letters. 104:023502

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), Silicon, business.industry, Nanowire, chemistry.chemical_element, Subthreshold slope, chemistry.chemical_compound, chemistry, MOSFET, Triethoxysilane, Optoelectronics, Field-effect transistor, business, Silicon oxide, (3-Aminopropyl)triethoxysilane

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d2a9f7eeb0a4f1620e567000198f6896
https://doi.org/10.1063/1.4861598

المؤلفون: Vikram Passi, Nicolas Breil, Jean-Pierre Raskin, Emmanuel Dubois, A. Lecestre, Denis Flandre, D.A. Yarekha, Nicolas Reckinger, Xiaohui Tang, Guilhem Larrieu, Vincent Bayot, Jacek Ratajczak

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), UCL - FSA/ELEC - Département d'électricité

المصدر: Applied Physics Letters
Applied Physics Letters, 2009, 95, pp.023106-1-3. ⟨10.1063/1.3171929⟩
Applied Physics Letters, American Institute of Physics, 2009, 95, pp.023106-1-3. ⟨10.1063/1.3171929⟩
Applied Physics Letters, Vol. 95, no. 2 (2009)

مصطلحات موضوعية: 010302 applied physics, Materials science, nanotechnology, Physics and Astronomy (miscellaneous), business.industry, Nanowire, Electrical Evaluation, Nanotechnology, platinum alloys, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, 01 natural sciences, nanowires, silicon alloys, Transmission electron microscopy, transmission electron microscopy, 0103 physical sciences, Optoelectronics, Planar process, Wafer, 0210 nano-technology, business, Silicon nanowires, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9904a80b7d2eb969a9417e1f5de9a7de
https://doi.org/10.1063/1.3171929