المؤلفون: Yongfa Kong, L. Shi, Wenbo Yan

المصدر: The European Physical Journal Applied Physics. 40:77-81

مصطلحات موضوعية: Absorption spectroscopy, Analytical chemistry, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Crystal, chemistry.chemical_compound, chemistry, Absorption band, Lattice (order), Lithium tantalate, Instrumentation, Chemical composition, Stoichiometry

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aed0f0fc4c642deffcc47bfa5e11c2c6
https://doi.org/10.1051/epjap:2007124

المؤلفون: E. M. Sheregii, N. N. Berchenko, B. Pukowska, A. Kisiel, M. Pociask

المصدر: The European Physical Journal Applied Physics. 27:403-406

مصطلحات موضوعية: Chemistry, Scanning electron microscope, Analytical chemistry, Electronic structure, Diffusion (business), Condensed Matter Physics, Electronic band structure, Instrumentation, Crystallographic defect, Isotropic etching, Cadmium telluride photovoltaics, Spectral line, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cf745513b39356d71eca69d26d9a4057
https://doi.org/10.1051/epjap:2004077

المؤلفون: Masayuki Fukuzawa, M. Yamada, H. Kakui, Y. Shiraishi

المصدر: The European Physical Journal Applied Physics. 27:447-450

مصطلحات موضوعية: Materials science, Photoluminescence, Silicon, Stacking, X-ray, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Crystallographic defect, Copper, Electronic, Optical and Magnetic Materials, law.invention, Crystallography, chemistry, Optical microscope, law, Wafer, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e17427b2c49bfef480fdaf448dacd153
https://doi.org/10.1051/epjap:2004104

المؤلفون: Gérard Guillot, Jean-Marie Bluet, D. Ziane, Corinne Sartel, I. El Harrouni

المصدر: The European Physical Journal Applied Physics. 27:235-238

مصطلحات موضوعية: Materials science, Photoluminescence, Wide-bandgap semiconductor, Analytical chemistry, Carrier lifetime, Condensed Matter Physics, Epitaxy, Crystallographic defect, Electronic, Optical and Magnetic Materials, symbols.namesake, symbols, Raman spectroscopy, Spectroscopy, Instrumentation, Quantum well

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84d2886dda8286dd461beaab304c4b33
https://doi.org/10.1051/epjap:2004105

المؤلفون: B. Kozankiewicz, D. Żymierska, A. Stonert, J. Auleytner, L. Nowicki, Adam Barcz, Dorota Klinger

المصدر: The European Physical Journal Applied Physics. 27:149-153

مصطلحات موضوعية: Materials science, Dopant, Silicon, Annealing (metallurgy), business.industry, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Ion, Monocrystalline silicon, Secondary ion mass spectrometry, Condensed Matter::Materials Science, Electron diffraction, chemistry, Optoelectronics, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a586f0367a3cd72df140604da91dceb9
https://doi.org/10.1051/epjap:2004133

المؤلفون: Shigeki Kanazawa, Yutaka Tokuda, Masayasu Ishiko, Hiroyuki Iwata, Takahide Sugiyama

المصدر: The European Physical Journal Applied Physics. 27:111-114

مصطلحات موضوعية: Materials science, Deep-level transient spectroscopy, Hydrogen, Silicon, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Schottky diode, Activation energy, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Ion implantation, chemistry, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::13ebded28383aa3be6c15818a7590d5d
https://doi.org/10.1051/epjap:2004114

المؤلفون: Sergio Pizzini, R. El Bouyadi, Bernard Pichaud, E. Leoni, Gabrielle Regula, Esidor Ntsoenzok, L. Martinelli

المصدر: The European Physical Journal Applied Physics. 27:89-92

مصطلحات موضوعية: Photoluminescence, Silicon, Chemistry, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Porous silicon, Crystallographic defect, Electronic, Optical and Magnetic Materials, Ion implantation, Wafer, Crystalline silicon, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3671f915c1bea84309d34849fabe006a
https://doi.org/10.1051/epjap:2004145

المؤلفون: A.G. Ulyashin, W. R. Fahrner, Reinhart Job, M. F. Beaufort, J. F. Barbot

المصدر: The European Physical Journal Applied Physics. 23:25-32

مصطلحات موضوعية: Silicon, Hydrogen, Annealing (metallurgy), Analytical chemistry, chemistry.chemical_element, Plasma, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, symbols.namesake, chemistry, Transmission electron microscopy, symbols, Wafer, Raman spectroscopy, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::520ef848084f6420b38a80fe2d739458
https://doi.org/10.1051/epjap:2003013

المؤلفون: A. Dunlop, N. Lorenzelli, D. Lesueur, Lionel Thomé, Alain Audouard

المساهمون: Centre de Spectrométrie Nucléaire et de Spectrométrie de Masse (CSNSM), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS)

المصدر: European Physical Journal: Applied Physics
European Physical Journal: Applied Physics, EDP Sciences, 1998, 3, pp.149-158. ⟨10.1051/epjap:1998217⟩

مصطلحات موضوعية: 010302 applied physics, Annealing (metallurgy), Chemistry, 61.43.Dq, 61.80.Jh, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Crystallographic defect, Electronic, Optical and Magnetic Materials, Amorphous solid, Ion, Crystallography, Swift heavy ion, Transmission electron microscopy, 0103 physical sciences, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Radiation damage, Irradiation, 0210 nano-technology, Instrumentation

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https://doi.org/10.1051/epjap:1998217

المؤلفون: Danièle Fournier, G. Jerosolimski, Stéphane Holé, C. Filloy, M.L. Polignano, I. Mica, Gilles Tessier

المصدر: Journal de Physique IV (Proceedings). 125:423-425

مصطلحات موضوعية: Microscope, Dielectric strength, Silicon, business.industry, Chemistry, Transistor, Analytical chemistry, General Physics and Astronomy, Transistor array, chemistry.chemical_element, Dielectric, equipment and supplies, Crystallographic defect, law.invention, law, Optoelectronics, business, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::06fdfee8e53bfbec1ec6c4797a46a8b5
https://doi.org/10.1051/jp4:2005125099