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11
المؤلفون: Jacek M. Baranowski, Rafał Bożek, Krzysztof Pakuła
المصدر: The European Physical Journal Applied Physics. 27:97-100
مصطلحات موضوعية: Kelvin probe force microscope, Physics, Range (particle radiation), Materials science, Morphology (linguistics), Condensed matter physics, Atomic force microscopy, business.industry, Band gap, media_common.quotation_subject, Condensed Matter Physics, Crystallographic defect, Molecular physics, Electronic, Optical and Magnetic Materials, Optics, Microscopy, Light induced, Contrast (vision), Thin film, business, Instrumentation, Photoconductive atomic force microscopy, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::45465e366a28f1084f5771fe84dbe349
https://doi.org/10.1051/epjap:2004116 -
12
المؤلفون: Masayuki Fukuzawa, M. Yamada, H. Kakui, Y. Shiraishi
المصدر: The European Physical Journal Applied Physics. 27:447-450
مصطلحات موضوعية: Materials science, Photoluminescence, Silicon, Stacking, X-ray, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Crystallographic defect, Copper, Electronic, Optical and Magnetic Materials, law.invention, Crystallography, chemistry, Optical microscope, law, Wafer, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e17427b2c49bfef480fdaf448dacd153
https://doi.org/10.1051/epjap:2004104 -
13
المؤلفون: T. Tuomi, G. Murphy, R. Simon, Patrick J. McNally, Paul F. Whelan
المصدر: The European Physical Journal Applied Physics. 27:443-446
مصطلحات موضوعية: Materials science, business.industry, Image processing, Condensed Matter Physics, Crystallographic defect, Streaking, Collimated light, Electronic, Optical and Magnetic Materials, Crystal, symbols.namesake, Optics, Fourier analysis, symbols, Dislocation, business, Instrumentation, Single crystal
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f2f0c485f7c4ec6d3811e6984a61aa5d
https://doi.org/10.1051/epjap:2004087 -
14
المؤلفون: Klara Lyutovich, Frank Ernst, Michael Oehme
المصدر: The European Physical Journal Applied Physics. 27:341-344
مصطلحات موضوعية: Materials science, business.industry, Process variable, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Crystal, Optics, Stress relaxation, Optoelectronics, Relaxation (physics), Process window, Dislocation, business, Instrumentation, Molecular beam epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a14f0fd7bead9b10fa5f5b317093a74a
https://doi.org/10.1051/epjap:2004051 -
15
المؤلفون: Gérard Guillot, Jean-Marie Bluet, D. Ziane, Corinne Sartel, I. El Harrouni
المصدر: The European Physical Journal Applied Physics. 27:235-238
مصطلحات موضوعية: Materials science, Photoluminescence, Wide-bandgap semiconductor, Analytical chemistry, Carrier lifetime, Condensed Matter Physics, Epitaxy, Crystallographic defect, Electronic, Optical and Magnetic Materials, symbols.namesake, symbols, Raman spectroscopy, Spectroscopy, Instrumentation, Quantum well
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84d2886dda8286dd461beaab304c4b33
https://doi.org/10.1051/epjap:2004105 -
16
المؤلفون: Victoria Corregidor, Edgardo Saucedo, L. Fornaro, Ernesto Diéguez
المصدر: The European Physical Journal Applied Physics. 27:427-430
مصطلحات موضوعية: Morphology (linguistics), Infrared, Scanning electron microscope, Chemistry, Crystal growth, Condensed Matter Physics, Crystallographic defect, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystallography, Chemical physics, Phase (matter), Ternary operation, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::525cfe8b041f0aee57eb4e7efa841b54
https://doi.org/10.1051/epjap:2004142 -
17
المؤلفون: M. Romero, S. Ostapenko
المصدر: The European Physical Journal Applied Physics. 27:55-58
مصطلحات موضوعية: Photoluminescence, Materials science, Silicon, business.industry, chemistry.chemical_element, Cathodoluminescence, Carrier lifetime, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Optics, Semiconductor, chemistry, Optoelectronics, Wafer, Dislocation, business, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::592a4473a0128add5f8b013d863cc9a7
https://doi.org/10.1051/epjap:2004042 -
18
المؤلفون: Robert Czernecki, Izabella Grzegory, Tadeusz Wosinski, Tadeusz Figielski, P. Perlin, O. Yastrubchak, A. Makosa, S. Porowski
المصدر: The European Physical Journal Applied Physics. 27:201-205
مصطلحات موضوعية: Materials science, Condensed matter physics, Kinetics, Mineralogy, Heterojunction, Substrate (electronics), Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Penning trap, Crystallographic defect, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Transmission electron microscopy, Charge carrier, Dislocation, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f825c398270b1d74333c51bcb7e2c501
https://doi.org/10.1051/epjap:2004139 -
19
المصدر: The European Physical Journal Applied Physics. 27:313-316
مصطلحات موضوعية: Photoluminescence, Chemistry, Band gap, Mineralogy, Electronic structure, Condensed Matter Physics, Molecular physics, Crystallographic defect, Semimetal, Electronic, Optical and Magnetic Materials, Blueshift, Direct and indirect band gaps, Instrumentation, Quasi Fermi level
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3b7d914ac47cc6a674213bfa86875fb7
https://doi.org/10.1051/epjap:2004056 -
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المؤلفون: Benjamin Damilano, Bernard Beaumont, Jean Massies, Mathieu Leroux, P. de Mierry, Philippe Vennéguès, Pierre Gibart, P. Lorenzini, S. Dalmasso
المصدر: The European Physical Journal Applied Physics. 27:259-262
مصطلحات موضوعية: Chemistry, Doping, Condensed Matter Physics, Epitaxy, Molecular physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Crystallography, Band bending, Transmission electron microscopy, Metalorganic vapour phase epitaxy, Thin film, Luminescence, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8bcb0901f7bdda9768042d07225a025d
https://doi.org/10.1051/epjap:2004119-2