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المؤلفون: Derek A Olson, Mitchell Luskin, Pavel B. Bochev, Alexander V. Shapeev
المصدر: ESAIM: Mathematical Modelling and Numerical Analysis. 50:1-41
مصطلحات موضوعية: Physics, Numerical Analysis, Optimization problem, Applied Mathematics, Constrained optimization, 010103 numerical & computational mathematics, Force balance, 01 natural sciences, Crystallographic defect, 010101 applied mathematics, Computational Mathematics, Modeling and Simulation, Lattice (order), Atomic lattice, Statistical physics, 0101 mathematics, Analysis
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1ab0ac02614111699fe17b343b8e1d52
https://doi.org/10.1051/m2an/2015023 -
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المؤلفون: Pia Seeberger, Julien Vidal
المساهمون: Department of Biomolecular Systems [Potsdam], Max Planck Institute of Colloids and Interfaces, Max-Planck-Gesellschaft-Max-Planck-Gesellschaft, School of Mathematics - University of Leeds, University of Leeds, School of Mathematics [Leeds]
المصدر: EPJ Photovoltaics, Vol 8, p 85505 (2017)
EPJ Photovoltaics
EPJ Photovoltaics, EDP sciences, 2017, 8, pp.85505. ⟨10.1051/epjpv/2017006⟩مصطلحات موضوعية: [PHYS]Physics [physics], Silicon, Renewable Energy, Sustainability and the Environment, Size dependent, lcsh:TJ807-830, Ab initio, lcsh:Renewable energy sources, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Crystallographic defect, Electronic, Optical and Magnetic Materials, Classical mechanics, chemistry, Vacancy defect, 0103 physical sciences, Statistical physics, Electrical and Electronic Engineering, 010306 general physics, 0210 nano-technology, Mathematics
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المؤلفون: Yongfa Kong, L. Shi, Wenbo Yan
المصدر: The European Physical Journal Applied Physics. 40:77-81
مصطلحات موضوعية: Absorption spectroscopy, Analytical chemistry, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Crystal, chemistry.chemical_compound, chemistry, Absorption band, Lattice (order), Lithium tantalate, Instrumentation, Chemical composition, Stoichiometry
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aed0f0fc4c642deffcc47bfa5e11c2c6
https://doi.org/10.1051/epjap:2007124 -
4
المصدر: Journal de Physique IV (Proceedings). 134:1035-1040
مصطلحات موضوعية: Shock wave, Phase transition, Crystallography, Materials science, Viscoplasticity, Stress–strain curve, Plane wave, General Physics and Astronomy, Thermodynamics, Strain hardening exponent, Dislocation, Crystallographic defect
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7587dcfa5b79fdf1bf0ee88ed8540fb0
https://doi.org/10.1051/jp4:2006134158 -
5Variation of end of range defects density with ion beam energy and dose: Experiments and simulations
المؤلفون: Filadelfo Cristiano, B. Colombeau, Alain Claverie, A. Essaid, L. Laânab, Caroline Bonafos
المصدر: Journal de Physique IV (Proceedings). 123:345-349
مصطلحات موضوعية: Thin layers, Ion beam, Silicon, Condensed matter physics, Annealing (metallurgy), business.industry, General Physics and Astronomy, chemistry.chemical_element, Crystallographic defect, Amorphous solid, Optics, Ion implantation, chemistry, Thin film, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a9a421174ce092c27fc4669c0cd75e4
https://doi.org/10.1051/jp4:2005123063 -
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المؤلفون: J.R. Niklas, Kay Dornich, Torsten Hahn, U. Kretzer, B. Gründig-Wendrock
المصدر: The European Physical Journal Applied Physics. 27:363-366
مصطلحات موضوعية: Work (thermodynamics), business.industry, Chemistry, Fermi level, Rate equation, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, symbols.namesake, Optics, Position (vector), Electrical resistivity and conductivity, symbols, Optoelectronics, Wafer, business, Instrumentation, Microwave
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9fc074baf9482ccc0d6a5e851d7aa7f8
https://doi.org/10.1051/epjap:2004111 -
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المؤلفون: Detlev Schulz, J. Doerschel, M. Nerding, H. P. Strunk, Dietmar Siche, H.-J. Rost, Klaus Irmscher
المصدر: The European Physical Journal Applied Physics. 27:243-246
مصطلحات موضوعية: Chemistry, Scanning electron microscope, Doping, Stacking, Condensed Matter Physics, Molecular physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Crystallography, Lamella (surface anatomy), Transmission electron microscopy, Electrical resistivity and conductivity, Instrumentation, Stacking fault
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ff905839de68664df84b6c81a6a64a1
https://doi.org/10.1051/epjap:2004057 -
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المؤلفون: Janusz Sadowski, M. Kaniewska, M. Guziewicz
المصدر: The European Physical Journal Applied Physics. 27:213-217
مصطلحات موضوعية: Deep-level transient spectroscopy, Chemistry, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, Band bending, Etching (microfabrication), Irradiation, Atomic physics, Instrumentation, Molecular beam, Extrinsic semiconductor, Molecular beam epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cb2fae9146cd94f0e7b8eb7cc72d19ca
https://doi.org/10.1051/epjap:2004127 -
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المؤلفون: E. M. Sheregii, N. N. Berchenko, B. Pukowska, A. Kisiel, M. Pociask
المصدر: The European Physical Journal Applied Physics. 27:403-406
مصطلحات موضوعية: Chemistry, Scanning electron microscope, Analytical chemistry, Electronic structure, Diffusion (business), Condensed Matter Physics, Electronic band structure, Instrumentation, Crystallographic defect, Isotropic etching, Cadmium telluride photovoltaics, Spectral line, Electronic, Optical and Magnetic Materials
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cf745513b39356d71eca69d26d9a4057
https://doi.org/10.1051/epjap:2004077 -
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المؤلفون: A. Shalimov, Andrzej Misiuk, J. Ratajczak, I. V. Antonova, J. Trela, J. Bak-Misiuk
المصدر: The European Physical Journal Applied Physics. 27:415-418
مصطلحات موضوعية: Diffraction, Hydrogen, Silicon, chemistry.chemical_element, Condensed Matter Physics, Crystallographic defect, Electronic, Optical and Magnetic Materials, law.invention, Crystallography, Ion implantation, chemistry, law, Transmission electron microscopy, X-ray crystallography, Electron microscope, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9b4511e39febb5aae34992872c2d3a1b
https://doi.org/10.1051/epjap:2004119-10