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المساهمون: Sharma, Dheeraj, Sharma, R K, Kaushik, B K, Kumar, Pankaj
المصدر: Circuit World. 37:27-34
مصطلحات موضوعية: BIST, Engineering, boundary scan, Boundary scan, business.industry, TPG, Test compression, faults, electronic engineering, electrical testing, Industrial and Manufacturing Engineering, Fault detection and isolation, Printed circuit board, Software, off-chip interconnects, Computer engineering, Built-in self-test, Verilog, Electrical and Electronic Engineering, business, Algorithm, computer, ModelSim, computer.programming_language