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المؤلفون: Blom, Tobias
مصطلحات موضوعية: Focused Ion Beam, FIB, SEM, Dielectrophoresis, Scanning Electron Microscopy, Nanostructuring, Nanogap electrodes, Nanofabrication, Electrical characterization, Electron Beam Lithography
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c456f59c2b4850d231dff1d79f3a2798
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940 -
2مورد إلكتروني
مصطلحات الفهرس: Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis, Doctoral thesis, comprehensive summary, info:eu-repo/semantics/doctoralThesis, text
URL:
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, 1651-6214 ; 745 -
3مورد إلكتروني
مصطلحات الفهرس: Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis, Doctoral thesis, comprehensive summary, info:eu-repo/semantics/doctoralThesis, text
URL:
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, 1651-6214 ; 745 -
4مورد إلكتروني
مصطلحات الفهرس: Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis, Doctoral thesis, comprehensive summary, info:eu-repo/semantics/doctoralThesis, text
URL:
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, 1651-6214 ; 745 -
5مورد إلكتروني
مصطلحات الفهرس: Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis, Doctoral thesis, comprehensive summary, info:eu-repo/semantics/doctoralThesis, text
URL:
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, 1651-6214 ; 745 -
6مورد إلكتروني
مصطلحات الفهرس: Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis, Doctoral thesis, comprehensive summary, info:eu-repo/semantics/doctoralThesis, text
URL:
http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-122940
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, 1651-6214 ; 745