-
1
المؤلفون: Michel Bosman
المصدر: Microscopy and Microanalysis. 21:2219-2220
مصطلحات موضوعية: Materials science, Instrumentation
-
2
المؤلفون: C. Fang, V. Viswanathan, Yu-Ping Wang, Michel Bosman, H. Hao, H. Giessen, J. Dorfmüller, Z. Ai, D.S. Pickard
المصدر: Microscopy and Microanalysis. 18:800-801
مصطلحات موضوعية: Materials science, chemistry, business.industry, chemistry.chemical_element, Optoelectronics, business, Instrumentation, Helium, Field ion microscope
-
3
المؤلفون: James M. LeBeau, Scott D. Findlay, Michel Bosman, Vicki J. Keast, Mark P. Oxley, Susanne Stemmer, Adrian J. D’Alfonso, Leslie J. Allen
المصدر: Microscopy and Microanalysis. 14:922-923
مصطلحات موضوعية: Materials science, Optics, Atomic resolution, business.industry, business, Instrumentation