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المؤلفون: Tom Willhammar, Xiaodong Zou
المصدر: Green Chemistry and Sustainable Technology ISBN: 9783662473948
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb9acd03926f8d622f4542d052347ba5
https://doi.org/10.1007/978-3-662-47395-5_5 -
2
المؤلفون: Christian Baerlocher, Fabian Gramm, Xiaodong Zou, Sven Hovmöller, Daliang Zhang, Junliang Sun, Zhanbing He, Lynne B. McCusker
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
مصطلحات موضوعية: Diffraction, Crystallography, Materials science, Electron diffraction, law, Chemical physics, Electron crystallography, Electron, Electron microscope, Selected area diffraction, High-resolution transmission electron microscopy, law.invention, Characterization (materials science)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4235ad889cf70282a63ccc293d809c2a
https://doi.org/10.1007/978-3-540-85156-1_379 -
3
المؤلفون: Peter Oleynikov, Xiaodong Zou, Sven Hovmöller
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
مصطلحات موضوعية: Diffraction, Physics, Optics, Electron diffraction, business.industry, Zone axis, Precession, Space group, Precession electron diffraction, Symmetry (geometry), Space (mathematics), business, Computational physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0174ececfc1394897e4b68975ec31631
https://doi.org/10.1007/978-3-540-85156-1_111 -
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المؤلفون: Xiaodong Zou, Daliang Zhang, Peter Oleynikov, Junliang Sun, Sven Hovmöller
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
مصطلحات موضوعية: Materials science, Quality (physics), Electron diffraction, Precession, Electron, Selected area diffraction, Projection (linear algebra), Symmetry (physics), Computational physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5adc9c815b0321e9d04d8fd7907b3c2f
https://doi.org/10.1007/978-3-540-85156-1_384 -
5
المؤلفون: Junliang Sun, Sven Hovmöller, Xiaodong Zou, Daliang Zhang
المصدر: EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540852254
مصطلحات موضوعية: Crystallography, Planar, Materials science, Stacking, Mineralogy, Porous medium, High-resolution transmission electron microscopy, Zeolite, Stacking fault
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::be614a64533631909bf5c155ceeca076
https://doi.org/10.1007/978-3-540-85226-1_340 -
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المؤلفون: Xiaodong Zou, Thomas E. Weirich, Sven Hovmöller
المصدر: Progress in Transmission Electron Microscopy 1 ISBN: 9783642087172
Progress in Transmission Electron Microscopy 1مصطلحات موضوعية: Crystallography, Materials science, Reflection high-energy electron diffraction, Electron diffraction, Electron crystallography, Crystallographic image processing, Selected area diffraction, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b2fe0393994664704af26c7d1ecb7812
https://doi.org/10.1007/978-3-662-09518-8_6