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المؤلفون: Hubert Moriceau, Caroline Rauer, C. Morales, François Rieutord, F. Fournel, Anne-Marie Charvet, J.M. Hartmann, D. Mariolle
المصدر: Microsystem Technologies. 19:675-679
مصطلحات موضوعية: Quantitative Biology::Biomolecules, Materials science, Silicon, Low-energy electron diffraction, chemistry.chemical_element, Direct bonding, Thermocompression bonding, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Hardware and Architecture, Chemical physics, Anodic bonding, Electrical and Electronic Engineering, Bond energy, Spectroscopy, Surface reconstruction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::464ecf138d30292fab35e435ff0173c2
https://doi.org/10.1007/s00542-013-1735-x -
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المؤلفون: T. Balster, Frank Stefan Tautz, S. Sloboshanin, V.M. Polyakov, Juergen A. Schaefer, U. Rossow, Ulrich Starke
المصدر: MRS Proceedings. 513
مصطلحات موضوعية: Materials science, Low-energy electron diffraction, Passivation, Silicon, Hydrogen, business.industry, Inorganic chemistry, Analytical chemistry, High resolution electron energy loss spectroscopy, chemistry.chemical_element, Semiconductor, X-ray photoelectron spectroscopy, chemistry, Etching, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b3fb9bd47c89f553b4f9fb7580df7a2
https://doi.org/10.1557/proc-513-3 -
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المؤلفون: Hans Lüth, A. Rizzi, D. Freundt, Ch. Dieker, B. Rösen, R. Carius, Dagmar Gerthsen
المصدر: MRS Proceedings. 320
مصطلحات موضوعية: Materials science, Silicon, chemistry, Low-energy electron diffraction, Analytical chemistry, chemistry.chemical_element, Heterojunction, Substrate (electronics), Atmospheric temperature range, Epitaxy, High-resolution transmission electron microscopy, Molecular beam epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d251a0d031ceb0dc77c1671a9479f1bf
https://doi.org/10.1557/proc-320-139 -
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المؤلفون: R. Cao, X. Yango, Piero Pianetta, Jeff Terry, Jihuai Wu, Joel B. Li
المصدر: MRS Proceedings. 312
مصطلحات موضوعية: Crystallography, Materials science, Silicon, chemistry, Electron diffraction, Low-energy electron diffraction, Transmission electron microscopy, Layer by layer, chemistry.chemical_element, Germanium, Thin film, Epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::82bd55174d334e63d5fa55143e5f4224
https://doi.org/10.1557/proc-312-243 -
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المؤلفون: J. R. Conner, Rodney A. McKee, F. J. Walker
المصدر: MRS Proceedings. 187
مصطلحات موضوعية: Crystallography, Auger electron spectroscopy, chemistry.chemical_compound, Materials science, chemistry, Copper silicide, Silicon, Low-energy electron diffraction, chemistry.chemical_element, Epitaxy, High-resolution transmission electron microscopy, Copper, Molecular beam epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7613799233741d1fea4899743fe8793f
https://doi.org/10.1557/proc-187-249 -
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المؤلفون: Leonard C. Feldman, H.-J. Gossmann
المصدر: MRS Proceedings. 56
مصطلحات موضوعية: Materials science, Silicon, chemistry, Low-energy electron diffraction, Layer by layer, chemistry.chemical_element, Substrate (electronics), Epitaxy, Microbiology, Deposition (chemistry), Molecular physics, Molecular beam epitaxy, Overlayer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::526865644e5edbf502ae0e0d3121bb52
https://doi.org/10.1557/proc-56-33 -
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المؤلفون: J. Van der Spiegel, William R. Graham, Forrest H. Kaatz
المصدر: MRS Proceedings. 160
مصطلحات موضوعية: Auger electron spectroscopy, Yield (engineering), Materials science, Silicon, chemistry, Low-energy electron diffraction, Electrical resistivity and conductivity, Analytical chemistry, chemistry.chemical_element, Terbium, Electrical measurements, Epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::76e1ace9ef726523236ff9171ebc4f38
https://doi.org/10.1557/proc-160-293 -
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المؤلفون: Clifton W. Draper, Steven L. Bernasek, Aubrey L. Helms, Chin-Chen Cho
المصدر: MRS Proceedings. 48
مصطلحات موضوعية: Auger electron spectroscopy, Materials science, Low-energy electron diffraction, Silicon, Ultra-high vacuum, chemistry.chemical_element, Laser, Molecular physics, law.invention, chemistry, law, Irradiation, Dislocation, Single crystal
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84a7c7fd815b19ff4dab4e5f5113f94c
https://doi.org/10.1557/proc-48-3 -
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المؤلفون: J. R. Noonan, C. W. White, G. W. Ownby, H. L. Davis, D. M. Zehner
المصدر: MRS Proceedings. 1
مصطلحات موضوعية: Auger electron spectroscopy, Materials science, Low-energy electron diffraction, Silicon, Ruby laser, Analytical chemistry, chemistry.chemical_element, Germanium, Epitaxy, law.invention, chemistry, Electron diffraction, law, Irradiation, Atomic physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ba6076411d1d21491c407e23802711f
https://doi.org/10.1557/proc-1-111 -
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المؤلفون: P. O. Hahn
المصدر: MRS Proceedings. 54
مصطلحات موضوعية: Materials science, Silicon, chemistry, Low-energy electron diffraction, Atom, Surface roughness, chemistry.chemical_element, Polishing, Wafer, Surface finish, Atomic units, Molecular physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5300f62e9492ac4432c9f5b48dab6744
https://doi.org/10.1557/proc-54-645