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المصدر: Materials Science Forum. :497-500
مصطلحات موضوعية: Materials science, Deep-level transient spectroscopy, Silicon, Mechanical Engineering, Doping, chemistry.chemical_element, Condensed Matter Physics, Crystallographic defect, Molecular physics, chemistry.chemical_compound, Ion implantation, chemistry, Mechanics of Materials, Vacancy defect, Electronic engineering, Silicon carbide, General Materials Science, Charge carrier
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fdc229f46e2584db32b3b617bbc899fb
https://doi.org/10.4028/www.scientific.net/msf.483-485.497