المؤلفون: ALBONETTI, CHIODINI, ANNIBALE, STOLIAR, MARTINEZ, R. V., GARCIA, BISCARINI

المصدر: Journal of microscopy (Online) n/a (2020). doi:10.1111/jmi.12938
info:cnr-pdr/source/autori:ALBONETTI, C. and CHIODINI, S. and ANNIBALE, P. and STOLIAR, P. and MARTINEZ, R. V. and GARCIA, R. and BISCARINI, F./titolo:Quantitative phase-mode electrostatic force microscopy on silicon oxide nanostructures/doi:10.1111%2Fjmi.12938/rivista:Journal of microscopy (Online)/anno:2020/pagina_da:/pagina_a:/intervallo_pagine:/volume:n%2Fa

مصطلحات موضوعية: Histology, Materials science, Electrostatic force microscopy, Electrostatic force microscope, Population, 02 engineering and technology, Electron, Molecular physics, Pathology and Forensic Medicine, 03 medical and health sciences, nanostructures, oxidation scanning probe lithography, Silicon oxide, education, 030304 developmental biology, 0303 health sciences, education.field_of_study, Resolution (electron density), Prolate spheroidal coordinates, 021001 nanoscience & nanotechnology, Electrostatics, silicon oxide, prolate spheroidal coordinates, 0210 nano-technology, Scanning probe lithography

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::84ba32081c135920b8f2a25857f684da