المؤلفون: Knezevic, T., Suligoj, T., Capan, I., Nanver, L.K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(6):2810-2817 Jun, 2021

المؤلفون: Civale, Y., Nanver, L. K., Schellevis, H.

المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 6(2):196-200 Mar, 2007

المؤلفون: Ivana Capan, Lis K. Nanver, Tomislav Suligoj, Tihomir Knezevic

المساهمون: Integrated Devices and Systems

المصدر: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, 68(6), 2810-2817. IEEE

مصطلحات موضوعية: Junctions, ultrashallow junctions, Silicon, Materials science, chemistry.chemical_element, pure boron (PureB) diodes, 01 natural sciences, law.invention, Single-photon avalanche diodes, law, 0103 physical sciences, Doping, Breakdown voltage, interface charge, photodiode, Electrical and Electronic Engineering, Photodiodes, Diode, 010302 applied physics, Equivalent series resistance, business.industry, cryogenic measurement, Schottky diode, Computational modeling, Electronic, Optical and Magnetic Materials, Photodiode, thin-film boron layers, chemistry, Performance evaluation, Optoelectronics, single-photon avalanche diode (SPAD), business, Aluminum, Dark current

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8e6872be007d1859f40d9de6e0f94b52
https://doi.org/10.1109/ted.2021.3074117