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المؤلفون: Alexandre Felten, Sébastien Faniel, Damien Cabosart, Sébastien Toussaint, Andra-Gabriela Iordanescu, Benoît Hackens, Nicolas Reckinger
المصدر: Nano Letters. 17(3):1344-1349
مصطلحات موضوعية: scanning gate microscopy, coherent transport, Bioengineering, Scanning gate microscopy, 02 engineering and technology, Ring (chemistry), 01 natural sciences, law.invention, law, 0103 physical sciences, mesoscopic transport, General Materials Science, 010306 general physics, relativistic Dirac particles, Quantum, Physics, Mesoscopic physics, Local density of states, Condensed matter physics, Graphene, business.industry, Mechanical Engineering, quantum scars, General Chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Semiconductor, Charge carrier, 0210 nano-technology, business
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المؤلفون: Alexandru Vlad, Nicolas Reckinger, Dan Lis, Michaël Sarrazin, Michaël Lobet, Jean-François Colomer, Francesca Cecchet
المساهمون: Univers, Transport, Interfaces, Nanostructures, Atmosphère et environnement, Molécules (UMR 6213) (UTINAM), Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS), Department of Physics and Research Group on Carbon Nanostructures (CARBONNAGe), Microelectronics Laboratory (Unite' DICE), Université Catholique de Louvain = Catholic University of Louvain (UCL), Laboratoire d'Etude du Rayonnement et de la Matière en Astrophysique (LERMA), École normale supérieure - Paris (ENS Paris), Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut national des sciences de l'Univers (INSU - CNRS)-Observatoire de Paris, Université Paris sciences et lettres (PSL)-Université de Cergy Pontoise (UCP), Université Paris-Seine-Université Paris-Seine-Centre National de la Recherche Scientifique (CNRS), Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS)-Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC), École normale supérieure - Paris (ENS-PSL)
المصدر: Nano Letters
Nano Letters, American Chemical Society, 2015, 16 (1), pp.48-54. ⟨10.1021/acs.nanolett.5b02494⟩
Nano Letters, 2015, 16 (1), pp.48-54. ⟨10.1021/acs.nanolett.5b02494⟩مصطلحات موضوعية: Materials science, Bioengineering, 02 engineering and technology, Trapping, 01 natural sciences, 7. Clean energy, Molecular physics, Signal, law.invention, Optics, law, 0103 physical sciences, Scattering, Radiation, General Materials Science, 010306 general physics, ComputingMilieux_MISCELLANEOUS, Plasmon, [PHYS]Physics [physics], Photons, Condensed Matter - Mesoscale and Nanoscale Physics, Graphene, business.industry, Mechanical Engineering, Surface plasmon, Second-harmonic generation, General Chemistry, Surface Plasmon Resonance, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Harmonic, Graphite, Gold, [PHYS.ASTR]Physics [physics]/Astrophysics [astro-ph], 0210 nano-technology, business, Order of magnitude, Physics - Optics
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3
المؤلفون: Xiaohui Tang, Constantin Augustin Dutu, Laurent Francis, Nicolas Reckinger, Jean-Pierre Raskin
المصدر: Nanotechnology. 25(11)
مصطلحات موضوعية: Resistive touchscreen, Materials science, Fabrication, Silicon, Mechanical Engineering, Transistor, chemistry.chemical_element, Bioengineering, Nanotechnology, General Chemistry, law.invention, chemistry, Nanoelectronics, Mechanics of Materials, law, Electrode, General Materials Science, Electrical and Electronic Engineering, Throughput (business), Stoichiometry
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4
المؤلفون: Jean-Pierre Raskin, Denis Flandre, Nicolas Reckinger, Xiaohui Tang, Laurent Francis, A. Karmous, Christophe Krzeminski, Jean-Pierre Colinge, Erich Kasper, Emmanuel Dubois, Aurélien Lecavelier des Etangs-Levallois, Zhenkun Chen
المساهمون: Institute of Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université Catholique de Louvain = Catholic University of Louvain (UCL), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Institut für Halbeitertechnik, Universität Stuttgart [Stuttgart], Tyndall National Institute, University College Cork (UCC)
المصدر: Nano Letters
Nano Letters, 2011, 11, pp.4520-4526. ⟨10.1021/nl202434k⟩
Nano Letters, American Chemical Society, 2011, 11, pp.4520-4526. ⟨10.1021/nl202434k⟩مصطلحات موضوعية: Offset (computer science), Materials science, Static Electricity, conduction-band offset, Single pair, Information Storage and Retrieval, FOS: Physical sciences, Bioengineering, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Single electron, 0103 physical sciences, Nano, Nanotechnology, quantum effects, General Materials Science, Well-defined, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electronic band structure, Leakage (electronics), 010302 applied physics, Condensed Matter - Materials Science, Quantum Physics, business.industry, Mechanical Engineering, Materials Science (cond-mat.mtrl-sci), Signal Processing, Computer-Assisted, General Chemistry, Equipment Design, heterostructure, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Equipment Failure Analysis, Energy Transfer, Semiconductors, Double floating-gate single-electron memory, Optoelectronics, 0210 nano-technology, business, Quantum Physics (quant-ph), Charge retention
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المؤلفون: Alain M. Jonas, Guilhem Larrieu, Jean-Pierre Raskin, Bernard Nysten, Nicolas Reckinger, Emmanuel Dubois, Xiaohui Tang, Vincent Bayot, Denis Flandre
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)
المصدر: Nanotechnology
Nanotechnology, 2008, 19, pp.165703-1-7. ⟨10.1088/0957-4484/19/16/165703⟩
Nanotechnology, Institute of Physics, 2008, 19, pp.165703-1-7. ⟨10.1088/0957-4484/19/16/165703⟩مصطلحات موضوعية: Materials science, Silicon, Analytical chemistry, chemistry.chemical_element, Silicon on insulator, Bioengineering, 02 engineering and technology, Surface finish, 01 natural sciences, law.invention, Etching (microfabrication), law, Residual stress, 0103 physical sciences, General Materials Science, Wafer, Electrical and Electronic Engineering, Thin film, 010302 applied physics, business.industry, Mechanical Engineering, Transistor, General Chemistry, 021001 nanoscience & nanotechnology, chemistry, Mechanics of Materials, Optoelectronics, 0210 nano-technology, business
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المؤلفون: Luc Henrard, Michaël Lobet, Nicolas Reckinger, Philippe Lambin
المصدر: Nanotechnology. 26:285702
مصطلحات موضوعية: Materials science, grapheme, Bioengineering, Chemical vapor deposition, law.invention, electromagnetic shielding, Optics, law, General Materials Science, Electrical and Electronic Engineering, Rigorous coupled-wave analysis, chemistry.chemical_classification, Graphene, business.industry, Mechanical Engineering, defects in grapheme, grain boundaries, Heterojunction, General Chemistry, Polymer, heterostructures, chemistry, Mechanics of Materials, Electromagnetic shielding, Optoelectronics, Grain boundary, simulations, business, Graphene nanoribbons
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