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المؤلفون: Stephen W. Carmichael
المصدر: Microscopy Today. 8:3-5
مصطلحات موضوعية: Microscope, Optics, Materials science, General Computer Science, law, Atomic force microscopy, business.industry, Matter wave, Electron, Electron microscope, business, Beam (structure), law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8310c99837f848af0b95b5c817fb858c
https://doi.org/10.1017/s1551929500054092