المؤلفون: Rossello, J.L., Bota, S., Canals, V., de Paul, I., Segura, J.

المصدر: The 2006 IEEE International Joint Conference on Neural Network Proceedings Neural Networks, 2006. IJCNN '06. International Joint Conference on. :659-663 2006

Relation: The 2006 IEEE International Joint Conference on Neural Network Proceedings

المؤلفون: Alorda, B., Bota, S., Segura, J.

المصدر: 11th IEEE International On-Line Testing Symposium On-line testing On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International. :177-182 2005

Relation: 11th IEEE International On-Line Testing Symposium

المؤلفون: Alorda, B., Canals, V., de Paul, I., Segura, J.

المصدر: Proceedings. 10th IEEE International On-Line Testing Symposium On-line testing On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International. :199-204 2004

Relation: Proceedings. 10th IEEE International On-Line Testing Symposium

المؤلفون: Bota, S.A., Rosales, M., Rosello, J.L., Keshavarzi, A., Segura, J.

المصدر: 2004 International Conferce on Test International test conference Test Conference, 2004. Proceedings. ITC 2004. International. :1276-1283 2004

Relation: Proceedings. International Test Conference 2004

المؤلفون: Alorda, B., Segura, J.

المصدر: 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003. On-line testing On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE. :178-182 2003

Relation: 9th International IEEE On-Line Testing Symposium

المؤلفون: Alorda, B., Bloechel, B., Keshavarzi, A., Segura, J.

المصدر: International Test Conference, 2003. Proceedings. ITC 2003. International test conference Test Conference, 2003. Proceedings. ITC 2003. International. 1:719-726 2003

Relation: Proceedings. International Test Conference 2003

المؤلفون: Font, J., Ginard, J., Isern, E., Roca, M., Segura, J., Garcia, E.

المصدر: Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) On-line testing workshop On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International. :94-98 2002

Relation: Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)

المؤلفون: Segura, J., Keshavarzi, A., Soden, J., Hawkins, C.

المصدر: Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :90-99 2002

Relation: International Test Conference

المؤلفون: Alorda, B., Rosales, M., Soden, J., Hawkins, C., Segura, J.

المصدر: Proceedings. International Test Conference International test conference Test Conference, 2002. Proceedings. International. :947-953 2002

Relation: International Test Conference

المؤلفون: de Paul, I., Rosales, M., Alorda, B., Segura, J., Hawkins, C., Soden, J.

المصدر: Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 VLSI test symposium VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001. :286-291 2001

Relation: Proceedings 19th IEEE VLSI Test Symposium. VTS 2001