المؤلفون: Ismail, N., Kalboussi, A.

المصدر: 2012 24th International Conference on Microelectronics (ICM) Microelectronics (ICM), 2012 24th International Conference on. :1-4 Dec, 2012

Relation: 2012 24th International Conference on Microelectronics (ICM)

المؤلفون: Ismail, N., Malbert, N., Labat, N., Touboul, A., Muraro, J.-L., Brasseau, F., Langrez, D.

المصدر: European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2005 Gallium Arsenide and other Compound Semiconductors Application Gallium Arsenide and Other Semiconductor Application Symposium, 2005. EGAAS 2005. European. :281-284 2005

Relation: 2005 13th European Gallium Arsenide and other Compound Semiconductors Application Symposium

المؤلفون: Ismail, N., Malbert, N., Labat, N., Touboul, A., Muraro, J.L.

المصدر: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the. :141-145 2005

Relation: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Ismail, N., Malbert, N., Labat, N., Touboul, A., Muraro, J.-L.

المصدر: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. Microelectronics Microelectronics, 2004. ICM 2004 Proceedings. The 16th International Conference on. :258-261 2004

Relation: The 16th International Conference on Microelectronics

المؤلفون: Malbert, N., Labat, N., Ismail, N., Touboul, A., Muraro, J.-L., Brasseau, F., Langrez, D.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 6(2):221-227 Jun, 2006