المؤلفون: Torikoshi, Yuma, Nishi, Yasuharu, Takahashi, Juichi

المصدر: 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET) MET Metamorphic Testing (MET), 2023 IEEE/ACM 8th International Workshop on. :25-30 May, 2023

Relation: 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET)