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المؤلفون: Antoni Ciszewski, I. R. Yarovets, Piotr Mazur, S. Zuber, P. V. Galiy, T. M. Nenchuk
المصدر: Scopus-Elsevier
مصطلحات موضوعية: 010302 applied physics, Materials science, Reflection high-energy electron diffraction, Low-energy electron diffraction, Polymer characterization, General Mathematics, Metals and Alloys, Scanning gate microscopy, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, Crystallography, law, 0103 physical sciences, Scanning tunneling microscope, 0210 nano-technology, Spectroscopy, Surface reconstruction, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1b96be07f6d7c04054ed1c5ad493e875
https://doi.org/10.15407/mfint.37.06.0789 -
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المؤلفون: Ayahiko Ichimiya
المصدر: Journal of the Vacuum Society of Japan. 59:19-25
مصطلحات موضوعية: Reflection high-energy electron diffraction, Materials science, Low-energy electron diffraction, Gas electron diffraction, Surfaces and Interfaces, Molecular physics, Crystal, Electron diffraction, General Materials Science, Diffraction topography, Selected area diffraction, Instrumentation, Spectroscopy, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::39d1ffda3c7d2beea7d076aa935c14f2
https://doi.org/10.3131/jvsj2.59.19 -
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المؤلفون: Joachim Wollschläger, Frederic Timmer
المصدر: Condensed Matter; Volume 2; Issue 1; Pages: 7
مصطلحات موضوعية: Diffraction, Surface (mathematics), Materials science, 02 engineering and technology, condensed_matter_physics, 01 natural sciences, Molecular physics, Domain (mathematical analysis), chemistry.chemical_compound, Optics, 0103 physical sciences, Silicide, 010306 general physics, Low-energy electron diffraction, business.industry, Function (mathematics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, chemistry, spot-profile analysis, one-dimensional physics, low energy electron diffraction, binary surface technique, supercell model, domain boundary, Supercell (crystal), 0210 nano-technology, business, Superstructure (condensed matter), Electron backscatter diffraction
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22d7a8a2cb12e09037f718188861900b
https://doi.org/10.20944/preprints201611.0058.v1 -
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المؤلفون: Yubiao Li, Andrea R. Gerson, Gujie Qian
المساهمون: Qian, Gujie, Li, Yubiao, Gerson, Andrea R
المصدر: Surface Science Reports. 70:86-133
مصطلحات موضوعية: Auger electron spectroscopy, Low-energy electron diffraction, microspectroscopic analysis, Scanning electron microscope, elemental mapping, Earth science, QEMSCAN, Metals and Alloys, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, surface analysis, synchrotron techniques, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Photoemission electron microscopy, spectromicroscopic analysis, X-ray photoelectron spectroscopy, grazing incidence, Microscopy, Materials Chemistry, Environmental science, Electron backscatter diffraction
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المؤلفون: Mubariz Nuriyev
المصدر: Physical Science International Journal. 5:165-171
مصطلحات موضوعية: Materials science, Reflection high-energy electron diffraction, Electron diffraction, Low-energy electron diffraction, Analytical chemistry, Energy filtered transmission electron microscopy, General Materials Science, Selected area diffraction, Powder diffraction, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1a8dc24f9ece5801d47af8492406358a
https://doi.org/10.9734/psij/2015/12881 -
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المؤلفون: Christoph Koch
المصدر: Modern Diffraction Methods
مصطلحات موضوعية: Length measurement, Crystallography, Materials science, Reflection high-energy electron diffraction, Low-energy electron diffraction, Electron diffraction, Energy filtered transmission electron microscopy, Instrumentation (computer programming), Selected area diffraction, Engineering physics, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::256045c5ae041a371916eb7e80f0717f
https://doi.org/10.1002/9783527649884.ch15 -
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المؤلفون: Leonard J. Brillson
المصدر: An Essential Guide to Electronic Material Surfaces and Interfaces ISBN: 9781119027140
An Essential Guide to Electronic Material Surfaces and Interfacesمصطلحات موضوعية: Materials science, Reflection high-energy electron diffraction, Low-energy electron diffraction, Electron diffraction, Electron tomography, Gas electron diffraction, Scanning confocal electron microscopy, Energy filtered transmission electron microscopy, Molecular physics, Electron backscatter diffraction
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المؤلفون: Christoph Koch
المصدر: Scopus-Elsevier
مصطلحات موضوعية: Diffraction, Physics, Reflection high-energy electron diffraction, Low-energy electron diffraction, business.industry, Electrons, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optics, Microscopy, Electron, Transmission, Electron diffraction, Angle of incidence (optics), Image Processing, Computer-Assisted, Nanotechnology, Precession electron diffraction, business, Instrumentation, Kikuchi line, Lighting, Electron backscatter diffraction
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المؤلفون: S. Fordham, G. I. Finch
المصدر: Journal of the Society of Chemical Industry. 56:632-639
مصطلحات موضوعية: Carbon film, Materials science, Reflection high-energy electron diffraction, Electron diffraction, Low-energy electron diffraction, Analytical chemistry, Selected area diffraction, Thin film, Electron backscatter diffraction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ba20fe65736e20c6b844fed2a466d469
https://doi.org/10.1002/jctb.5000562804 -
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المؤلفون: Aimo Winkelmann, Gert Nolze
المصدر: Ultramicroscopy. 110:190-194
مصطلحات موضوعية: Materials science, Reflection high-energy electron diffraction, Low-energy electron diffraction, Electron diffraction, Scanning electron microscope, Diffraction topography, Atomic physics, Inelastic scattering, Instrumentation, Kikuchi line, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Electron backscatter diffraction