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1مؤتمر
المؤلفون: La Spina, L., Schellevis, H., Nenadovic, N., Nanver, L.K.
المصدر: 2006 25th International Conference on Microelectronics Microelectronics, 2006 25th International Conference on. :338-341 2006
Relation: 2006 25th International Conference on Microelectronics
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2مؤتمر
المؤلفون: Nenadovic, N., La Spina, L., d'Alessandro, V., Nanver, L.K.
المصدر: Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Biopolar/BiCMOS Circuits and Technology Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the. :45-49 2005
Relation: Proceedings of the 2005 Biopolar/BiCMOS Circuits and Technology Meeting
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3مؤتمر
المؤلفون: La Spina, L., Nenadovic, N., d'Alessandro, V., Nanver, L.K., Rinaldi, N.
المصدر: EUROCON 2005 - The International Conference on "Computer as a Tool" Computer as a Tool, 2005. EUROCON 2005.The International Conference on. 1:879-882 2005
Relation: EUROCON 2005 The International Conference on "Computer as a Tool"
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4دورية أكاديمية
المؤلفون: La Spina, L., d'Alessandro, V., Russo, S., Rinaldi, N., Nanver, L. K.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(3):483-491 Mar, 2009
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5مؤتمر
المؤلفون: Russo, S., d'Alessandro, V., Spina, L. La, Rinaldi, N., Nanver, L. K.
المصدر: 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE. :95-98 Oct, 2009
Relation: 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM
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6مؤتمر
المؤلفون: Spina, L. La, d'Alessandro, V., Russo, S., Rinaldi, N., Nanver, L. K.
المصدر: 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting, 2009. BCTM 2009. IEEE. :21-24 Oct, 2009
Relation: 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM
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7مؤتمر
المؤلفون: d'Alessandro, V., La Spina, L., Rinaldi, N., Nanver, L. K.
المصدر: 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting, 2008. BCTM 2008. IEEE. :85-88 Oct, 2008
Relation: 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM
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8مؤتمر
المؤلفون: La Spina, L., Nanver, L. K., Schellevis, H., Iborra, E., Clement, M., Olivares, J.
المصدر: ESSDERC 2007 - 37th European Solid State Device Research Conference Solid State Device Research Conference, 2007. ESSDERC 2007. 37th European. :354-357 Sep, 2007
Relation: ESSDERC 2007 - 37th European Solid State Device Research Conference
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9مؤتمر
المؤلفون: La Spina, L., d'Alessandro, V., Santagata, F., Rinaldi, N., Nanver, L. K.
المصدر: 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting Bipolar/BiCMOS Circuits and Technology Meeting, 2007. BCTM '07. IEEE. :131-134 Sep, 2007
Relation: 2007 IEEE Bipolar/BiCMOS Circuits and Technology Meeting
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10
المؤلفون: La Spina, L.
المساهمون: Nanver, L.K.
المصدر: None
مصطلحات موضوعية: safe operating area, thermal coupling, thermal instability, thermal resistance, self-heating, ballasting resistor, electrothermal effects, aluminum nitride (AlN), heterojunction bipolar transistor (HBT), bipolar junction transistor (BJT), silicon-on-glass (SOG), multifinger device, heatspreaders, mutual thermal resistance
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::4ff70aab5d0b4d55742ace1e6c12a30b
http://resolver.tudelft.nl/uuid:76a2ded0-b96a-402d-a23c-db6ee4ff52b2