المساهمون: Franciosi, A [Univ. of Minnesota, Minneapolis (United States)]

المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

وصف الملف: Medium: X; Size: Pages: 2415-2422

URL الوصول: http://www.osti.gov/scitech/biblio/7305968

المساهمون: Margaritondo, G [Ecole Polytechnique Federale, Lausanne (Switzerland)]

المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

وصف الملف: Medium: X; Size: Pages: 2294-2300

URL الوصول: http://www.osti.gov/scitech/biblio/7237794

المساهمون: Kaindl, G [Freie Univ. Berlin (Germany)]

المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

وصف الملف: Medium: X; Size: Pages: 2108-2113

URL الوصول: http://www.osti.gov/scitech/biblio/7237667

المساهمون: Thomas, A [Sektion Physik der TU Dresden (Germany)]

المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

وصف الملف: Medium: X; Size: Pages: 2206-2211

URL الوصول: http://www.osti.gov/scitech/biblio/7115803

المساهمون: Lay, G [Univ. de Provence, Marseille (France)]

المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

وصف الملف: Medium: X; Size: Pages: 2349-2354

URL الوصول: http://www.osti.gov/scitech/biblio/7115780

المساهمون: Harbison, J [Bellcore, Red Bank, NJ (United States)]

المصدر: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States); 9:4; Conference: 18. annual conference on physics and chemistry of semiconductor interfaces, Long Beach, CA (United States), 29 Jan - 1 Feb 1991

وصف الملف: Medium: X; Size: Pages: 2083-2089

URL الوصول: http://www.osti.gov/scitech/biblio/7047688

المساهمون: Davidonis, R

المصدر: Instrum. Exp. Tech. (Engl. Transl.); (United States); 29:3; Other Information: Translated from Prib. Tekh. Eksp. (Kiev), No. 3, 76-79(May-Jun 1986)

وصف الملف: Medium: X; Size: Pages: 590-593

URL الوصول: http://www.osti.gov/scitech/biblio/6608615

المساهمون: Smith, N

المصدر: J. Vac. Sci. Technol., A; (United States); 3:3

وصف الملف: Medium: X; Size: Pages: 1637-1638

URL الوصول: http://www.osti.gov/scitech/biblio/6873815

المساهمون: Sheffield, J

المصدر: Other Information: A maximum of 6 parameters can be fitted

وصف الملف: Medium: X; Size: Pages: v

URL الوصول: http://www.osti.gov/scitech/biblio/6236133

المساهمون: Pappas, D [IBM Almaden Research Center, San Jose, CA (United States)]

المصدر: Conference: Spring meeting of the Materials Research Society, San Francisco, CA (United States), 12-16 Apr 1993

وصف الملف: Medium: ED; Size: Pages: (6 p)

URL الوصول: http://www.osti.gov/scitech/servlets/purl/6543693