يعرض 1 - 2 نتائج من 2 نتيجة بحث عن '"boundary scan test"', وقت الاستعلام: 0.78s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

    Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  2. 2
    مؤتمر

    المؤلفون: Xiaopeng, Deng, Simao, Xu, Yong, Zhang

    المصدر: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on. 1:264-270 Aug, 2013

    Relation: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI)