المؤلفون: Zheng, Dan, Ning, Puqi, Qiu, Zhijie, Sun, Wei, Fan, Tao, Wen, Xuhui

المصدر: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2023 IEEE 6th International. :1945-1950 May, 2023

Relation: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC)

المؤلفون: Qu, Z., Wang, W., Yang, Z., Bao, Q., Li, X.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-8 2023

المؤلفون: Xia, Fangzhou^Aff4, Rangelow, Ivo W.^Aff5, Youcef-Toumi, Kamal^Aff6

المساهمون: Xia, Fangzhou^Aff1, Rangelow, Ivo W.^Aff2, Youcef-Toumi, Kamal^Aff3

المصدر: Active Probe Atomic Force Microscopy : A Practical Guide on Precision Instrumentation. :25-53

المؤلفون: Zhang, Ming^Aff39, Luo, Xin^Aff39, Ji, Dongri^Aff39

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Chakraborty, Samarjit, Series Editor^Aff3, Chen, Jiming, Series Editor^Aff4, Chen, Shanben, Series Editor^Aff5, Chen, Tan Kay, Series Editor^Aff6, Dillmann, Rüdiger, Series Editor^Aff7, Duan, Haibin, Series Editor^Aff8, Ferrari, Gianluigi, Series Editor^Aff9, Ferre, Manuel, Series Editor^Aff10, Jabbari, Faryar, Series Editor^Aff11, Jia, Limin, Series Editor^Aff12, Kacprzyk, Janusz, Series Editor^Aff13, Khamis, Alaa, Series Editor^Aff14, Kroeger, Torsten, Series Editor^Aff15, Li, Yong, Series Editor^Aff16, Liang, Qilian, Series Editor^Aff17, Martín, Ferran, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Mukhopadhyay, Subhas, Series Editor^Aff22, Ning, Cun-Zheng, Series Editor^Aff23, Nishida, Toyoaki, Series Editor^Aff24, Oneto, Luca, Series Editor^Aff25, Panigrahi, Bijaya Ketan, Series Editor^Aff26, Pascucci, Federica, Series Editor^Aff27, Qin, Yong, Series Editor^Aff28, Seng, Gan Woon, Series Editor^Aff29, Speidel, Joachim, Series Editor^Aff30, Veiga, Germano, Series Editor^Aff31, Wu, Haitao, Series Editor^Aff32, Zamboni, Walter, Series Editor^Aff33, Zhang, Junjie James, Series Editor^Aff34, Tan, Kay Chen, Series Editor^Aff35, Hung, Jason C., editor^Aff36, Yen, Neil, editor^Aff37, Chang, Jia-Wei, editor^Aff38

المصدر: Frontier Computing on Industrial Applications Volume 3 : Proceedings of Theory, Technologies and Applications (FC 2023). 1133:96-102

المؤلفون: Taniguchi, Yuta, Sugiura, Hirotaka, Yamanaka, Tashiro, Watanabe, Shiro, Omata, Seiji, Harada, Kanako, Mitsuishi, Mamoru, Ueta, Takashi, Shiraya, Tomoyasu, Sugimoto, Koichiro, Totsuka, Kiyohito, Araki, Fumiyuki, Takao, Muneyuki, Aihara, Makoto, Arai, Fumihito

المصدر: 2021 21st International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers) SSolid-State Sensors, Actuators and Microsystems (Transducers), 2021 21st International Conference on. :487-490 Jun, 2021

Relation: 2021 21st International Conference on Solid-State Sensors, Actuators and Microsystems (Transducers)

المؤلفون: Weizhou Zhu, Yue Guo, Qiyi Jin, Xue Wang, Xingguang Qian, Yong Xie, Lingqiang Meng, Jianjun Jia

المصدر: Photonics, Vol 10, Iss 12, p 1365 (2023)

مصطلحات موضوعية: heterodyne interferometer, tilt-to-length noise, equal-arm length, optical path jitter, high-precision measurement, Applied optics. Photonics, TA1501-1820

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2304-6732/10/12/1365; https://doaj.org/toc/2304-6732

URL الوصول: https://doaj.org/article/8c1be74c7d9f47759514130b0a1b913f

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المؤلفون: Xianjun, Yi, Cuimei, Liu

المصدر: 2009 9th International Conference on Electronic Measurement & Instruments Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on. :1-795-1-799 Aug, 2009

Relation: 2009 9th International Conference on Electronic Measurement & Instruments (ICEMI)