المؤلفون: Li, Xinyi, Chen, Zehua, Chu, Ziyuan, Zhang, Taijia, Sun, Yuyin, Zhang, Yimeng, Zhang, Yuming

المصدر: 2023 4th International Conference on Advanced Electrical and Energy Systems (AEES) Advanced Electrical and Energy Systems (AEES), 2023 4th International Conference on. :67-71 Dec, 2023

Relation: 2023 4th International Conference on Advanced Electrical and Energy Systems (AEES)

المؤلفون: Ding, Yun, Zhang, Yuming, Zhang, Yimeng, Wei, Guowei

المصدر: 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA) Integrated Circuits, Technologies and Applications (ICTA), 2021 IEEE International Conference on. :92-93 Nov, 2021

Relation: 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)

المؤلفون: Li, He, Zhang, Yimeng, Yoshihara, Tsutomu

المصدر: 2013 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2013 International. :064-067 Nov, 2013

Relation: 2013 International Soc Design Conference (ISOCC)

المؤلفون: Zhang, Yimeng, Huang, Mengshu, Wang, Nan, Goto, Satoshi, Yoshihara, Tsutomu

المصدر: IEEE Asian Solid-State Circuits Conference 2011 Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian. :213-216 Nov, 2011

Relation: 2011 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Nan Wang, Zhang, Yimeng, Yoshihara, Tsutomu

المصدر: 2011 International Conference on Electronic Devices, Systems and Applications (ICEDSA) Electronic Devices, Systems and Applications (ICEDSA), 2011 International Conference on. :25-28 Apr, 2011

Relation: 2011 International Conference on Electronic Devices, Systems and Applications (ICEDSA)

المؤلفون: Zhang, Yimeng, Okamura, Leona, Wang, Nan, Yoshihara, Tsutomu

المصدر: 2010 International SoC Design Conference SoC Design Conference (ISOCC), 2010 International. :127-130 Nov, 2010

Relation: 2010 International SoC Design Conference (ISOCC 2010)

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تسجيل الدخول للوصول الكامل.

المؤلفون: Song, Qingwen, Yang, Shuai, Tang, Guannan, Han, Chao, Zhang, Yimeng, Tang, Xiaoyan, Zhang, Yimen, Zhang, Yuming

المصدر: IEEE Electron Device Letters; Apr2016, Vol. 37 Issue 4, p463-466, 4p

مصطلحات موضوعية: SILICON carbide, METAL oxide semiconductor field-effect transistors, LOGIC circuits, BREAKDOWN voltage, ELECTRIC breakdown, PERFORMANCE evaluation