-
1
المؤلفون: Michaël Sarrazin, S. Devouge, M. Voue, I. Septembre, C. Seassal, A. Hendrickx, Sébastien Faniel, R. Mazurczyk, L. Dellieu, Nicolas Reckinger, G. Fleury, Olivier Deparis
المساهمون: Univers, Transport, Interfaces, Nanostructures, Atmosphère et environnement, Molécules (UMR 6213) (UTINAM), Université de Franche-Comté (UFC), Université Bourgogne Franche-Comté [COMUE] (UBFC)-Université Bourgogne Franche-Comté [COMUE] (UBFC)-Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS), Université de Namur [Namur] (UNamur), Laboratoire de Chimie des Polymères Organiques (LCPO), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Ecole Nationale Supérieure de Chimie, de Biologie et de Physique (ENSCBP)-Université de Bordeaux (UB)-Institut de Chimie du CNRS (INC), Team 4 LCPO : Polymer Materials for Electronic, Energy, Information and Communication Technologies, Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Ecole Nationale Supérieure de Chimie, de Biologie et de Physique (ENSCBP)-Université de Bordeaux (UB)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Ecole Nationale Supérieure de Chimie, de Biologie et de Physique (ENSCBP)-Université de Bordeaux (UB)-Institut de Chimie du CNRS (INC), Institut des Nanotechnologies de Lyon (INL), Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-École Centrale de Lyon (ECL), Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École supérieure de Chimie Physique Electronique de Lyon (CPE), Université Catholique de Louvain = Catholic University of Louvain (UCL), University of Mons [Belgium] (UMONS), Université de Mons (UMons)
المصدر: Sarrazin, M, Septembre, I, Hendrickx, A, Reckinger, N, Dellieu, L, Fleury, G, Seassal, C, Mazurczyk, R, Faniel, S, Devouge, S, Voue, M & Deparis, O 2020, ' Toward an experimental proof of superhydrophobicity enhanced by quantum fluctuations freezing on a broadband-absorber metamaterial ', Journal of Applied Physics, vol. 128, no. 20, 0021541 . https://doi.org/10.1063/5.0021541
Journal of Applied Physics
Journal of Applied Physics, American Institute of Physics, 2020, 128 (20), pp.204303. ⟨10.1063/5.0021541⟩مصطلحات موضوعية: Photon, Silicon, General Physics and Astronomy, chemistry.chemical_element, FOS: Physical sciences, 02 engineering and technology, 01 natural sciences, Physics::Fluid Dynamics, Vacuum energy, 0103 physical sciences, Mesoscale and Nanoscale Physics (cond-mat.mes-hall), cond-mat.mes-hall, Quantum, Quantum fluctuation, 010302 applied physics, Physics, Condensed Matter - Materials Science, Condensed matter physics, Condensed Matter - Mesoscale and Nanoscale Physics, Metamaterial, Materials Science (cond-mat.mtrl-sci), 021001 nanoscience & nanotechnology, cond-mat.mtrl-sci, Condensed Matter::Soft Condensed Matter, [CHIM.POLY]Chemical Sciences/Polymers, chemistry, Extreme ultraviolet, Frequency domain, 0210 nano-technology
وصف الملف: application/pdf
-
2
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Dispositifs Intégrés et Circuits Electroniques Machine Learning Group (DICE - MLG), Université Catholique de Louvain = Catholic University of Louvain (UCL), Contrat Européen, Université Catholique de Louvain-la-Neuve
المصدر: IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology, 2009, 8 (9), pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2009, 8 (9), pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2009, 8, pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩مصطلحات موضوعية: FOS: Computer and information sciences, Materials science, Nanowire, Computer Science - Emerging Technologies, FOS: Physical sciences, 02 engineering and technology, Integrated circuit, 01 natural sciences, scaling limits, Flash memory, non volatile memories, device scaling, law.invention, [PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], Memory cell, law, 0103 physical sciences, Electronic engineering, Process optimization, Electrical and Electronic Engineering, 010302 applied physics, Condensed Matter - Materials Science, business.industry, Materials Science (cond-mat.mtrl-sci), quantum dot, 021001 nanoscience & nanotechnology, Computer Science Applications, Non-volatile memory, Emerging Technologies (cs.ET), Nanoelectronics, Quantum dot, single-electron device, silicon on insulator technology (SOI), flash memories, Optoelectronics, 0210 nano-technology, business, Process modeling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2dd67207b42220606d9d328b18050943
https://researchportal.unamur.be/en/publications/37c2e85d-056e-48d8-9781-2ae2572b6832
-
3
المؤلفون: Michaël Sarrazin, Jean-Jacques Letesson, Christian Didembourg, Emeline Lawarée, Jean-François Colomer, Jean-Yves Matroule, Olivier Deparis, Nicolas Reckinger, Louis Dellieu
مصطلحات موضوعية: Materials science, chemistry.chemical_element, FOS: Physical sciences, Nanotechnology, Chemical vapor deposition, Conductivity, law.invention, Metal, law, General Materials Science, Physics - Biological Physics, Condensed Matter - Materials Science, biology, Graphene, Substrate (chemistry), Materials Science (cond-mat.mtrl-sci), General Chemistry, biology.organism_classification, Copper, Chemical engineering, chemistry, Biological Physics (physics.bio-ph), visual_art, visual_art.visual_art_medium, Antibacterial activity, Bacteria
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd6c258f93213cb8a418162d70da9f9e
-
4
المؤلفون: Alexandre Felten, Jean-François Colomer, Nicolas Reckinger, Cristiane Nascimento Santos, Benoît Hackens
مصطلحات موضوعية: Condensed Matter - Materials Science, Materials science, Hydrogen, Graphene, Inorganic chemistry, chemistry.chemical_element, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, General Chemistry, Copper, law.invention, chemistry, Amorphous carbon, law, Impurity, Oxidizing agent, General Materials Science, Carbon, Cooling down
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c8453aa6df5782511fd186d29a6747dd
-
5
المؤلفون: Jean-Pierre Raskin, Denis Flandre, Nicolas Reckinger, Xiaohui Tang, Laurent Francis, A. Karmous, Christophe Krzeminski, Jean-Pierre Colinge, Erich Kasper, Emmanuel Dubois, Aurélien Lecavelier des Etangs-Levallois, Zhenkun Chen
المساهمون: Institute of Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université Catholique de Louvain = Catholic University of Louvain (UCL), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Institut für Halbeitertechnik, Universität Stuttgart [Stuttgart], Tyndall National Institute, University College Cork (UCC)
المصدر: Nano Letters
Nano Letters, 2011, 11, pp.4520-4526. ⟨10.1021/nl202434k⟩
Nano Letters, American Chemical Society, 2011, 11, pp.4520-4526. ⟨10.1021/nl202434k⟩مصطلحات موضوعية: Offset (computer science), Materials science, Static Electricity, conduction-band offset, Single pair, Information Storage and Retrieval, FOS: Physical sciences, Bioengineering, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Single electron, 0103 physical sciences, Nano, Nanotechnology, quantum effects, General Materials Science, Well-defined, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Hardware_ARITHMETICANDLOGICSTRUCTURES, Electronic band structure, Leakage (electronics), 010302 applied physics, Condensed Matter - Materials Science, Quantum Physics, business.industry, Mechanical Engineering, Materials Science (cond-mat.mtrl-sci), Signal Processing, Computer-Assisted, General Chemistry, Equipment Design, heterostructure, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Equipment Failure Analysis, Energy Transfer, Semiconductors, Double floating-gate single-electron memory, Optoelectronics, 0210 nano-technology, business, Quantum Physics (quant-ph), Charge retention
-
6
المؤلفون: Alexandru Vlad, Jacek Ratajczak, Jean-Pierre Raskin, A. Laszcz, Emmanuel Dubois, Constantin Augustin Dutu, Sylvie Godey, Xiaohui Tang, Nicolas Reckinger
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Institute of Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université Catholique de Louvain = Catholic University of Louvain (UCL)
المصدر: Journal of The Electrochemical Society
Journal of The Electrochemical Society, Electrochemical Society, 2011, 158, pp.H715-H723. ⟨10.1149/1.3585777⟩مصطلحات موضوعية: Materials science, Annealing (metallurgy), Schottky barrier, Ultra-high vacuum, Analytical chemistry, chemistry.chemical_element, FOS: Physical sciences, 02 engineering and technology, 01 natural sciences, Oxygen, Erbium, chemistry.chemical_compound, X-ray photoelectron spectroscopy, 0103 physical sciences, Silicide, Materials Chemistry, Electrochemistry, 010302 applied physics, [PHYS]Physics [physics], Condensed Matter - Materials Science, Renewable Energy, Sustainability and the Environment, Materials Science (cond-mat.mtrl-sci), 021001 nanoscience & nanotechnology, Condensed Matter Physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amorphous solid, chemistry, 0210 nano-technology
-
7
المؤلفون: Nicolas Reckinger, Guilhem Larrieu, Jean-Pierre Raskin, Aryan Afzalian, Emmanuel Dubois, Xiaohui Tang, Denis Flandre
المساهمون: IEMN - ISEN, LAAS - CNRS, UCL - SST/ICTM - Institute of Information and Communication Technologies, Electronics and Applied Mathematics, UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Université Catholique de Louvain = Catholic University of Louvain (UCL)
المصدر: Applied Physics Letters, Vol. 98, no. 11, p. 112102 (16 March 2011)
Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2011, 98, pp.112102-1-3. ⟨10.1063/1.3567546⟩
Applied Physics Letters, 2011, 98 (11), pp.1121021. ⟨10.1063/1.3567546⟩مصطلحات موضوعية: Condensed Matter - Materials Science, Materials science, Physics and Astronomy (miscellaneous), Dopant, business.industry, Schottky barrier, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Schottky diode, Field emission, chemistry.chemical_compound, chemistry, Silicide, Optoelectronics, Tunneling current, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Current (fluid), business, Nanoscopic scale, Voltage
-
8
المؤلفون: Constantin Augustin Dutu, Jean-Pierre Raskin, Claude Poleunis, Xiaohui Tang, Emmanuel Dubois, Nicolas Reckinger, Arnaud Delcorte
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Université Catholique de Louvain = Catholic University of Louvain (UCL)
المصدر: Applied Physics Letters
Applied Physics Letters, American Institute of Physics, 2011, 99, pp.012110-1-3. ⟨10.1063/1.3608159⟩
Applied Physics Letters, 2011, 99 (1), pp.012110. ⟨10.1063/1.3608159⟩مصطلحات موضوعية: 010302 applied physics, Condensed Matter - Materials Science, Materials science, Physics and Astronomy (miscellaneous), Dopant, Annealing (metallurgy), Schottky barrier, Analytical chemistry, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, [SPI.TRON]Engineering Sciences [physics]/Electronics, Ion, Erbium, chemistry, 0103 physical sciences, Redistribution (chemistry), 0210 nano-technology, Arsenic
-
9
المؤلفون: Nicolas Reckinger, Emmanuel Dubois, Alexandre Villaret, Xiaohui Tang, Christophe Krzeminski, D.-C. Bensahel, Vincent Bayot
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Dispositifs Intégrés et Circuits Electroniques Machine Learning Group (DICE - MLG), Université Catholique de Louvain = Catholic University of Louvain (UCL), STMicroelectronics [Crolles] (ST-CROLLES), contrat européen
المصدر: IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2006, 5, pp.649-656
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2006, 5 (6), p. 649. ⟨10.1109/TNANO.2006.883481⟩
IEEE Transactions on Nanotechnology, 2006, 5 (6), p. 649. ⟨10.1109/TNANO.2006.883481⟩
IEEE Transactions on Nanotechnology, 2006, 5, pp.649-656مصطلحات موضوعية: Materials science, Fabrication, single-electron memory, FOS: Physical sciences, 02 engineering and technology, Engraving, 01 natural sciences, Etching (microfabrication), 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Coulomb blockade effect, 010302 applied physics, Condensed Matter - Materials Science, Quantum Physics, nanotechnology, business.industry, Process (computing), Electrical engineering, Materials Science (cond-mat.mtrl-sci), Coulomb blockade, 021001 nanoscience & nanotechnology, arsenic-assisted etching and oxidation effects, Computer Science Applications, Non-volatile memory, Nanoelectronics, visual_art, visual_art.visual_art_medium, Optoelectronics, Non-volatile random-access memory, Quantum Physics (quant-ph), 0210 nano-technology, business, self-aligned floating gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a44041cc66ef34051e0898252d54bdd2
https://hal.archives-ouvertes.fr/hal-00138655
-
10
المؤلفون: Vincent Bayot, André Crahay, Nicolas Reckinger, Christophe Krzeminski, Xiaohui Tang, Emmanuel Dubois
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Dispositifs Intégrés et Circuits Electroniques Machine Learning Group (DICE - MLG), Université Catholique de Louvain = Catholic University of Louvain (UCL), Financement européen, projet européen SASEM
المصدر: 2004 Materials and Processes for Nonvolatile Memories Symposium-Materials Research Society Symposium Proceedings
Mater. Res. Soc. Symp. Proc.
Materials Research Society Fall Meeting
Materials Research Society Fall Meeting, Nov 2004, Boston, United States. pp.D1.6.1
Scopus-Elsevierمصطلحات موضوعية: Fabrication, Materials science, Process modeling, 020209 energy, Nanowire, Mechanical engineering, FOS: Physical sciences, Nanotechnology, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, scaling limits, Flash memory, device scaling, non volatile memories, Nano, 0202 electrical engineering, electronic engineering, information engineering, Hardware_INTEGRATEDCIRCUITS, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Condensed Matter - Materials Science, Process (computing), Materials Science (cond-mat.mtrl-sci), quantum dot, 021001 nanoscience & nanotechnology, Quantum dot, single-electron device, silicon on insulator technology (SOI), flash memories, 0210 nano-technology, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98ea9e08ca5afc0c7014a01e26450343
https://hal.archives-ouvertes.fr/hal-00140991
إعادة تعيين المنقحات
عرض المنقحات (%%عد%%)
Find this article in full text from Scitation. 
Find this issue from the American Chemical Society