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المؤلفون: Sarah J. Haigh, David Cooper, Evan Tillotson, A.P. Conlan, Alexander M. Rakowski
المصدر: Journal of Microscopy
مصطلحات موضوعية: 0303 health sciences, Histology, Materials science, Microscope, Scanning electron microscope, business.industry, Electron energy loss spectroscopy, Polishing, 02 engineering and technology, 021001 nanoscience & nanotechnology, Focused ion beam, Pathology and Forensic Medicine, law.invention, 03 medical and health sciences, Lamella (surface anatomy), Optics, law, Transmission electron microscopy, Scanning transmission electron microscopy, 0210 nano-technology, business, 030304 developmental biology
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المؤلفون: Sarah J. Haigh, Roman V. Gorbachev
المصدر: Nature Materials. 20:908-909
مصطلحات موضوعية: Materials science, Microscope, business.industry, Graphene, Mechanical Engineering, 02 engineering and technology, General Chemistry, 010402 general chemistry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, 0104 chemical sciences, law.invention, Lattice (module), Optics, Mechanics of Materials, law, Scanning transmission electron microscopy, Physics::Atomic and Molecular Clusters, General Materials Science, MAGIC (telescope), 0210 nano-technology, business
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المؤلفون: Colin R. Woods, Yi Bo Wang, Eric Prestat, Kostya S. Novoselov, Tatiana Latychevskaia, Matthew Holwill, Sarah J. Haigh
المصدر: Frontiers of Physics
Latychevskaia, T, Woods, C R, Wang, Y B, Holwill, M, Prestat, E, Haigh, S J & Novoselov, K S 2019, ' Convergent and divergent beam electron holography and reconstruction of adsorbates on free-standing two-dimensional crystals ', Frontiers of Physics, vol. 14, no. 1, 13606 . https://doi.org/10.1007/s11467-018-0851-6مصطلحات موضوعية: Physics - Instrumentation and Detectors, convergent beam electron diffraction, electron holography, Materials science, Physics and Astronomy (miscellaneous), in-line holograms, diffraction, Phase (waves), Holography, FOS: Physical sciences, 01 natural sciences, objects, law.invention, Crystal, Optics, National Graphene Institute, Stack (abstract data type), law, Mesoscale and Nanoscale Physics (cond-mat.mes-hall), 0103 physical sciences, Monolayer, van der waals structures, phase, two-dimensional materials, 010306 general physics, Wavefront, Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics, business.industry, graphene, Resolution (electron density), van der Waals structures, Materials Science (cond-mat.mtrl-sci), faults, Instrumentation and Detectors (physics.ins-det), simulation, contrast, Electron diffraction, ResearchInstitutes_Networks_Beacons/national_graphene_institute, microscopy, business
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المؤلفون: Eric Prestat, Matthew Holwill, Sarah J. Haigh, Kostya S. Novoselov, Tatiana Latychevskaia, Colin R. Woods, Yi Bo Wang
المصدر: Proceedings of the National Academy of Sciences
Latychevskaia, T, Woods, C, Wang, Y, Holwill, M, Prestat, E, Haigh, S & Novoselov, K 2018, ' Convergent beam electron holography for analysis of van der Waals heterostructures ', Proceedings of the National Academy of Sciences . https://doi.org/10.1073/pnas.1722523115مصطلحات موضوعية: Diffraction, Convergent Beam Electron Diffraction, Materials science, Physics - Instrumentation and Detectors, Electron Holography, Holography, Stacking, FOS: Physical sciences, 02 engineering and technology, Electron, Applied Physics (physics.app-ph), Interference (wave propagation), 01 natural sciences, Electron holography, law.invention, Optics, Stack (abstract data type), National Graphene Institute, law, 0103 physical sciences, Mesoscale and Nanoscale Physics (cond-mat.mes-hall), 010306 general physics, Condensed Matter - Materials Science, Multidisciplinary, Two-dimensional Materials, Condensed Matter - Mesoscale and Nanoscale Physics, business.industry, Materials Science (cond-mat.mtrl-sci), Instrumentation and Detectors (physics.ins-det), Physics - Applied Physics, 021001 nanoscience & nanotechnology, Condensed Matter - Other Condensed Matter, van der Waals Structures, ResearchInstitutes_Networks_Beacons/national_graphene_institute, Physical Sciences, Graphene, 0210 nano-technology, business, Surface reconstruction, Other Condensed Matter (cond-mat.other)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a523d7574ee0cfd53409213ecab6c46
http://arxiv.org/abs/1807.01927 -
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المؤلفون: Sarah J. Haigh
المصدر: Acta Crystallographica Section A Foundations and Advances. 70:521-523
مصطلحات موضوعية: Elemental imaging, business.industry, Nanoparticle, Condensed Matter Physics, Biochemistry, Crystallographic defect, Cadmium telluride photovoltaics, Inorganic Chemistry, Optics, Structural Biology, Elemental analysis, Atom, Scanning transmission electron microscopy, Optoelectronics, General Materials Science, Physical and Theoretical Chemistry, Dislocation, business
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المؤلفون: Angus I. Kirkland, Hidetaka Sawada, Sarah J. Haigh
مصطلحات موضوعية: Conventional transmission electron microscope, Materials science, Optics, Atomic de Broglie microscope, Contrast transfer function, Electron tomography, business.industry, Scanning transmission electron microscopy, Scanning confocal electron microscopy, Phase-contrast imaging, General Physics and Astronomy, business, High-resolution transmission electron microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc63f5286ae390d3e5be6be40827d1ac
https://ora.ox.ac.uk/objects/uuid:a9f5c72c-1563-4590-b564-07c90370084d -
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المؤلفون: Hidetaka Sawada, Sarah J. Haigh, Kunio Takayanagi, Angus I. Kirkland
مصطلحات موضوعية: Conventional transmission electron microscope, Optics, Contrast transfer function, Electron tomography, business.industry, Chemistry, Scanning transmission electron microscopy, Resolution (electron density), Scanning confocal electron microscopy, business, High-resolution transmission electron microscopy, Instrumentation, Dark field microscopy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::86d599805a2ab42b167d9e7fb8246ab9
https://ora.ox.ac.uk/objects/uuid:e362cfe9-5b81-4316-9e34-3099f4a15489 -
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المؤلفون: Laurence D. Marks, Judy S. Kim, Sarah J. Haigh, J. Ciston, Angus I. Kirkland
مصطلحات موضوعية: Optics, High resolution electron microscopy, Materials science, Cryo-electron microscopy, business.industry, Scanning confocal electron microscopy, Charge density, Energy filtered transmission electron microscopy, Space (mathematics), business, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::959cb097843232e33eab68d7c77817dd
https://doi.org/10.1017/s1431927609094719 -
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المؤلفون: Sarah J. Haigh, Angus I. Kirkland, Hidetaka Sawada
مصطلحات موضوعية: Physics, Microscope, business.industry, General Mathematics, Aperture synthesis, General Engineering, General Physics and Astronomy, Magnitude (mathematics), law.invention, Tilt (optics), Optics, law, Beam tilt, Transmission electron microscopy, Spatial frequency, business, Beam (structure)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::258f2aafbf7eafbcb03045bfd1ec036f
https://doi.org/10.1098/rsta.2009.0124 -
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المؤلفون: Sarah J. Haigh, Angus I. Kirkland
مصطلحات موضوعية: Azimuth, Physics, Tilt (optics), Optics, business.industry, business, Instrumentation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4f0fd4ad19e8025c47e51d386a6775d
https://ora.ox.ac.uk/objects/uuid:17477cf8-3880-4eb8-9439-6e0a9cce758b