يعرض 1 - 10 نتائج من 901 نتيجة بحث عن '"electron holography"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Vectorial metasurface holography.

    المؤلفون: Song, Qinghua, Liu, Xingsi, Qiu, Cheng-Wei, Genevet, Patrice

    المصدر: Applied Physics Reviews; Mar2022, Vol. 9 Issue 1, p1-20, 20p

    مصطلحات موضوعية: OPTICAL polarization, ELECTRON holography, DEGREES of freedom, HOLOGRAPHY, PHOTONICS, OPTICS

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  2. 2
    Computational evaluation of sparse coding on off-axis electron holograms: comparison between charge-coupled device and direct-detection device cameras

    المؤلفون: Yuki Nomura, Kazuo Yamamoto, Tsukasa Hirayama, Satoshi Anada

    المصدر: Microscopy. 71:41-49

    مصطلحات موضوعية: Physics, Pixel, business.industry, Noise reduction, Holography, Shot noise, Noise (electronics), Electron holography, law.invention, Optics, Interference (communication), Structural Biology, law, Radiology, Nuclear Medicine and imaging, Charge-coupled device, business, Instrumentation

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98fe114c8779d1cd13dc4e99219b684a
    https://doi.org/10.1093/jmicro/dfab031

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  3. 3
    Interference and interferometry in electron holography

    المؤلفون: Ken Harada

    المصدر: Microscopy

    مصطلحات موضوعية: electron wave, Electromagnetic field, electron holography, reconstruction, wavefront, Holography, Physics::Optics, Electron, Interference (wave propagation), Electron holography, law.invention, Optics, Structural Biology, law, Special Issue Paper, transmission electron microscopy, Radiology, Nuclear Medicine and imaging, phase, Instrumentation, Physics, Wavefront, business.industry, Physics::Physics Education, Interference microscopy, interference microscopy, Interferometry, AcademicSubjects/SCI00960, business

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03133c001b37eedfd416a08755a59ab1
    https://doi.org/10.1093/jmicro/dfaa033

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  4. 4
    Lensless Fourier transform electron holography applied to vortex beam analysis

    المؤلفون: Yoshimasa A. Ono, Ken Harada, Yoshio Takahashi

    المصدر: Microscopy

    مصطلحات موضوعية: Letter, electron holography, helical wavefront, Phase (waves), Holography, Physics::Optics, Electron holography, law.invention, symbols.namesake, Optics, Structural Biology, law, lens-less Fourier transform holography, Radiology, Nuclear Medicine and imaging, reciprocal space, Instrumentation, Physics, Plane (geometry), business.industry, Bragg's law, spherical wavefront, Reciprocal lattice, Fourier transform, Amplitude, symbols, business, vortex beam

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cdb8e5c4f96a71b84b27cee7f405ad59
    https://doi.org/10.1093/jmicro/dfaa008

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  5. 5
    Comparison Between Moiré Sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis Strain Characterization Method and Dark-Field Electron Holography

    المؤلفون: Viraj Whabi, Gianluigi A. Botton, S. Ghanad-Tavakoli, A. Pofelski

    المصدر: Microscopy and Microanalysis. 27:1982-1984

    مصطلحات موضوعية: Materials science, Optics, Strain (chemistry), business.industry, Scanning transmission electron microscopy, Sampling (statistics), Moiré pattern, business, Phase analysis, Instrumentation, Dark field microscopy, Electron holography, Characterization (materials science)

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2202c9387ec01bddef11bbbbdfe96b9e
    https://doi.org/10.1017/s1431927621007224

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  6. 6
    Holography: application to high-resolution imaging

    المؤلفون: Toshiaki Tanigaki, Yoshio Takahashi, Takeshi Kawasaki

    المصدر: Microscopy. 70:39-46

    مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Resolution (electron density), Holography, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electron holography, law.invention, Optics, Structural Biology, law, Transmission electron microscopy, Magnetic imaging, 0103 physical sciences, Radiology, Nuclear Medicine and imaging, Electron microscope, 0210 nano-technology, business, Instrumentation, High resolution imaging

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6101fee2bdd332295cf3567b8a3caddf
    https://doi.org/10.1093/jmicro/dfaa050

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  7. 7
    Electron holography on Fraunhofer diffraction

    المؤلفون: Ken Harada, Yoshimasa A. Ono, Tetsuji Kodama, Daisuke Shindo, Tetsuya Akashi, Keiko Shimada, Kodai Niitsu, Shigeo Mori, Hiroyuki Shinada

    المصدر: Microscopy

    مصطلحات موضوعية: electron holography, genetic structures, Plane wave, Phase (waves), Holography, Physics::Optics, 02 engineering and technology, Fraunhofer diffraction, 01 natural sciences, Article, Electron holography, law.invention, symbols.namesake, Optics, Structural Biology, law, Condensed Matter::Superconductivity, 0103 physical sciences, Radiology, Nuclear Medicine and imaging, double slit, phase distribution, Instrumentation, 010302 applied physics, Physics, business.industry, interferometry, 021001 nanoscience & nanotechnology, eye diseases, Reciprocal lattice, Interferometry, Amplitude, biological sciences, symbols, bacteria, sense organs, 0210 nano-technology, business

    وصف الملف: application/pdf

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::60a213e723fab1d9a520b2d9603ec5c6
    https://doi.org/10.1093/jmicro/dfz007

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  8. 8
    Holography and Coherent Diffraction Imaging with Low-(30–250 eV) and High-(80–300 keV) Energy Electrons: History, Principles, and Recent Trends

    المؤلفون: Latychevskaia, Tatiana

    المساهمون: University of Zurich, Latychevskaia, Tatiana

    المصدر: Materials
    Materials, Vol 13, Iss 3089, p 3089 (2020)

    مصطلحات موضوعية: Diffraction, electron holography, 530 Physics, Holography, diffraction, Physics::Optics, 10192 Physics Institute, 02 engineering and technology, Electron, Review, lcsh:Technology, 01 natural sciences, biomolecules, Electron holography, coherent diffraction imaging, law.invention, 010309 optics, Optics, law, iterative phase retrieval, 0103 physical sciences, Microscopy, General Materials Science, lcsh:Microscopy, lcsh:QC120-168.85, Physics, lcsh:QH201-278.5, lcsh:T, business.industry, 021001 nanoscience & nanotechnology, Coherent diffraction imaging, 2500 General Materials Science, Interferometry, lcsh:TA1-2040, lcsh:Descriptive and experimental mechanics, holography, lcsh:Electrical engineering. Electronics. Nuclear engineering, lcsh:Engineering (General). Civil engineering (General), 0210 nano-technology, business, lcsh:TK1-9971, Electron scattering, in-line holography

    وصف الملف: materials-13-03089-v2.pdf - application/pdf

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::040f97e89405f9a083d84c05387c7ece
    http://europepmc.org/articles/PMC7412140

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  9. 9
    Dark-field electron holography as a recording of crystal diffraction in real space: a comparative study with high-resolution X-ray diffraction for strain analysis of MOSFETs

    المؤلفون: Delphine Le Cunff, Alain Claverie, Daniel Benoit, Patrice Gergaud, Aurèle Durand, Matthew Wormington, Martin Hÿtch, Victor Boureau, Denis Rouchon

    المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Centre d'élaboration de matériaux et d'études structurales (CEMES), Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie de Toulouse (ICT-FR 2599), Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Institut de Chimie du CNRS (INC)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche pour le Développement (IRD)-Institut de Chimie du CNRS (INC)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Matériaux et dispositifs pour l'Electronique et le Magnétisme (CEMES-MEM), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Université Toulouse III - Paul Sabatier (UT3), Interférométrie, In situ et Instrumentation pour la Microscopie Electronique (CEMES-I3EM), Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut de Chimie de Toulouse (ICT), Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Institut de Recherche pour le Développement (IRD)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse)

    المصدر: Journal of Applied Crystallography
    Journal of Applied Crystallography, International Union of Crystallography, 2020, 53 (4), pp.885-895. ⟨10.1107/S1600576720006020⟩
    Journal of Applied Crystallography, 2020, 53 (4), pp.885-895. ⟨10.1107/S1600576720006020⟩

    مصطلحات موضوعية: Diffraction, Photon, Materials science, elastic strain, diffraction, metal-oxide-semiconductor field-effect-transistor (MOSFET), 02 engineering and technology, Electron, 01 natural sciences, General Biochemistry, Genetics and Molecular Biology, Electron holography, Optics, 0103 physical sciences, [CHIM.CRIS]Chemical Sciences/Cristallography, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det], [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 010302 applied physics, business.industry, Bragg's law, [PHYS.MECA.MSMECA]Physics [physics]/Mechanics [physics]/Materials and structures in mechanics [physics.class-ph], 021001 nanoscience & nanotechnology, Dark field microscopy, high-resolution xray diffraction (HRXRD), geometric phase, Transmission electron microscopy, X-ray crystallography, 0210 nano-technology, business, dark-field electron holography (DFEH)

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9a708bd42204c10f341a599ff13be0a8

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  10. 10
    Revisiting phase detection limits in electron holography through dynamic automation

    المؤلفون: Cemes-Cnrs, Martin Hytch

    المصدر: Proceedings of the European Microscopy Congress 2020.

    مصطلحات موضوعية: Optics, Materials science, business.industry, business, Automation, Phase detector, Electron holography

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e17761c7fc16754a36287b87b4451b5f
    https://doi.org/10.22443/rms.emc2020.439

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