يعرض 51 - 60 نتائج من 776 نتيجة بحث عن '"Low-energy electron diffraction"', وقت الاستعلام: 0.94s تنقيح النتائج
  1. 51
    Effect of adsorbed Sn on Ge diffusivity on Si(111) surface

    المؤلفون: B. Z. Olshanetsky, A. E. Dolbak

    المصدر: Open Physics, Vol 6, Iss 3, Pp 634-637 (2008)

    مصطلحات موضوعية: Materials science, Diffusion, surfactant, QC1-999, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, 68.35.fx, Germanium, Thermal diffusivity, surface structure, Adsorption, Nuclear magnetic resonance, tin, Monolayer, surface, 68.35.bg, Surface diffusion, Auger electron spectroscopy, low energy electron diffraction, Low-energy electron diffraction, Physics, silicon, auger electron spectroscopy, 68.43.jk, surface diffusion, germanium, chemistry

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a2633830bb9f420ef505cb43b4a8952c
    https://doaj.org/article/9dfd3af518ff43d0ac6ab3e914d14fdc

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  2. 52
    دورية أكاديمية
    Low temperature growth of epitaxial graphene on SiC induced by carbon evaporation.

    المؤلفون: Al-Temimy, A., Riedl, C., Starke, U.

    المصدر: Applied Physics Letters; 12/7/2009, Vol. 95 Issue 23, p231907, 3p, 1 Color Photograph, 2 Graphs

    مصطلحات موضوعية: EPITAXY, GRAPHENE, ULTRAHIGH vacuum, LOW energy electron diffraction, SILICON

    Find this article in full text from Scitation.
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  3. 53
    دورية أكاديمية
    In situ investigation of growth and thermal stability of ultrathin Si layers on the HfO2/Si (100) high-κ dielectric system.

    المؤلفون: Lebedinskii, Yu. Yu., Zenkevich, A., Gusev, E. P., Gribelyuk, M.

    المصدر: Applied Physics Letters; 5/9/2005, Vol. 86 Issue 19, p191904, 3p, 1 Diagram, 3 Graphs

    مصطلحات موضوعية: SPECTRUM analysis, PHOTOELECTRON spectroscopy, ELECTRON diffraction, LOW energy electron diffraction, SILICON, HAFNIUM

    Find this article in full text from Scitation.
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  4. 54
    دورية أكاديمية
    Controlled striped phase formation on ultraflat Si(001) surfaces during diborane exposure.

    المؤلفون: Nielsen, J.-F., Pelz, J. P., Hibino, H., Hu, C.-W., Tsong, I. S. T., Kouvetakis, J.

    المصدر: Applied Physics Letters; 12/3/2001, Vol. 79 Issue 23, p3857, 3p, 3 Diagrams

    مصطلحات موضوعية: SILICON, LOW energy electron diffraction

    Find this article in full text from Scitation.
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  5. 55
    Ge diffusion on Si surfaces

    المؤلفون: B. Z. Olshanetsky, A. E. Dolbak

    المصدر: Open Physics, Vol 4, Iss 3, Pp 310-317 (2006)

    مصطلحات موضوعية: Surface diffusion, Auger electron spectroscopy, low energy electron diffraction, Reflection high-energy electron diffraction, Materials science, Low-energy electron diffraction, Silicon, Diffusion, Physics, QC1-999, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, silicon, 68.35.fx, Germanium, Atmospheric temperature range, auger electron spectroscopy, 68.47.fg, surface structure, surface diffusion, germanium, chemistry, surface, Atomic physics

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae4949d8a4d3d9a3bfa2ddfaa5b51b34
    https://doaj.org/article/0b9b325b9b974c5d8b4a8fcd75c6e914

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  6. 56
    Mechanism of Cu transport along clean Si surfaces

    المؤلفون: A. E. Dolbak, R. A. Zhachuk, B. Z. Olshanetsky

    المصدر: Open Physics, Vol 1, Iss 3, Pp 463-473 (2003)

    مصطلحات موضوعية: Materials science, Silicon, QC1-999, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, surface segregation, 68.35.b, surface structure, 68.35.f, Grain boundary diffusion coefficient, surface, Diffusion (business), Surface diffusion, Auger electron spectroscopy, low energy electron diffraction, Low-energy electron diffraction, 68.43.b, Physics, silicon, Atmospheric temperature range, auger electron spectroscopy, surface diffusion, chemistry, Diffusion process, copper, Atomic physics

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae0903261910a5db7904dd2aa2bc3886
    https://doaj.org/article/cbe2e615e708448fbed9050e49f1fb98

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  7. 57
    Unoccupied Electronic States at the Interface of Oligo(phenylene-vinylene) Films with Oxidized Silicon

    المؤلفون: A. A. Gavrikov, Alexei S. Komolov, Eleonora F. Lazneva, N. S. Chepilko, S. N. Akhremtchik

    المصدر: The Journal of Physical Chemistry C. 117:12633-12638

    مصطلحات موضوعية: Materials science, Silicon, Low-energy electron diffraction, Fermi level, Analytical chemistry, chemistry.chemical_element, Substrate (electronics), Electronic structure, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, symbols.namesake, General Energy, chemistry, Phenylene, symbols, Density functional theory, Work function, Physical and Theoretical Chemistry

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b438404e5ccaf531453689e5f963790d
    https://doi.org/10.1021/jp4027223

    Find this issue from the American Chemical Society
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  8. 58
    Hydrophobic direct bonding of silicon reconstructed surfaces

    المؤلفون: Hubert Moriceau, Caroline Rauer, C. Morales, François Rieutord, F. Fournel, Anne-Marie Charvet, J.M. Hartmann, D. Mariolle

    المصدر: Microsystem Technologies. 19:675-679

    مصطلحات موضوعية: Quantitative Biology::Biomolecules, Materials science, Silicon, Low-energy electron diffraction, chemistry.chemical_element, Direct bonding, Thermocompression bonding, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Hardware and Architecture, Chemical physics, Anodic bonding, Electrical and Electronic Engineering, Bond energy, Spectroscopy, Surface reconstruction

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::464ecf138d30292fab35e435ff0173c2
    https://doi.org/10.1007/s00542-013-1735-x

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  9. 59
    Silicon-induced faceting at the Ag(110) surface

    المؤلفون: Stefano Colonna, Fabio Ronci, Giulia Serrano, Paola Gori, Antonio Cricenti

    المساهمون: Fabio, Ronci, Giulia, Serrano, Gori, Paola, Antonio, Cricenti, Stefano, Colonna

    المصدر: Physical review. B, Condensed matter and materials physics 89 (2014): 115437. doi:10.1103/PhysRevB.89.115437
    info:cnr-pdr/source/autori:Fabio Ronci, Giulia Serrano, Paola Gori, Antonio Cricenti, and Stefano Colonna/titolo:Silicon-induced faceting at the Ag(110) surface/doi:10.1103%2FPhysRevB.89.115437/rivista:Physical review. B, Condensed matter and materials physics/anno:2014/pagina_da:115437/pagina_a:/intervallo_pagine:115437/volume:89

    مصطلحات موضوعية: Materials science, Condensed matter physics, Low-energy electron diffraction, Silicon, Silicene, chemistry.chemical_element, Substrate (electronics), Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Faceting, chemistry, Electron diffraction, law, silicon, Ag(110), silicene nanoribbons, scanning tunneling microscopy, low-energy electron diffraction, density functional theory calculations, Facet, Scanning tunneling microscope

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::77c01050c0136a65b17ffd540658b502
    https://doi.org/10.1103/physrevb.89.115437

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  10. 60
    Amorphous to crystalline phase transition: onset of pattern formation during ion erosion of Si(001)

    المؤلفون: Engler, M., Michely, T.

    المصدر: Physical Review B 93(2016), 085423

    مصطلحات موضوعية: low energy electron diffraction, pattern formation, ion beam erosion, LEED, STM, silicon, scanning tunneling microscopy, Si(001)

    وصف الملف: application/pdf

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______4577::20ec2912a332b1af7ced7ce4b46dbefb
    https://www.hzdr.de/publications/Publ-22642-1

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