المؤلفون: Ryzhkova Maria, Tsukanov Dmitry

المصدر: St. Petersburg Polytechnical University Journal: Physics and Mathematics, Vol 15, Iss 3.1 (2022)

مصطلحات موضوعية: silicon, electrical conductance, surface structures, metal films, low-energy electron diffraction, Mathematics, QA1-939, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://physmath.spbstu.ru/article/2022.58.18/; https://doaj.org/toc/2405-7223

URL الوصول: https://doaj.org/article/5672c67f9d6c48b4a0c9aaa37a1fd3e0

المؤلفون: Chatel, Carole, Mathieu, Ludovic, Aïche, Mourad, Diakaki, Maria, Noguere, Gilles, Bouland, Olivier

المصدر: EPJ Web of Conferences; 11/19/2021, Vol. 254, p1-5, 5p

مصطلحات موضوعية: NEUTRONS, ELASTIC scattering, LOW energy electron diffraction, IONIZATION (Atomic physics), SILICON

المساهمون: Zasada, I

المصدر: Physical Review B; 7004; 4; Other Information: Submitted to Physical Review B: Volume 7004, No.4; Journal Publication Date: 07/2004; PBD: 1 Mar 2004

وصف الملف: Medium: ED; Size: vp.; OS: Win98

URL الوصول: http://www.osti.gov/scitech/servlets/purl/840041

المؤلفون: Cavalcoli, Daniela, Rossi, Marco, Cavallini, Anna

المصدر: Journal of Applied Physics; Mar2011, Vol. 109 Issue 5, p053719, 6p, 4 Graphs

مصطلحات موضوعية: NANOCRYSTALS, SILICON, THIN films, PHOTOVOLTAIC power generation, LOW energy electron diffraction, OPTOELECTRONIC devices

المؤلفون: Karakalos, Stavros, Siokou, Angeliki, Dracopoulos, Vasileios, Sutara, Frantisek, Skala, Tomas, Skoda, Michal, Ladas, Spyros, Prince, Kevin, Matolin, Vladimir, Chab, Vladimir

المصدر: Journal of Chemical Physics; 3/14/2008, Vol. 128 Issue 10, p104705, 7p, 1 Black and White Photograph, 1 Diagram, 1 Chart, 5 Graphs

مصطلحات موضوعية: MAGNESIUM, CHLORINE, THIN films, SILICON, PHOTOELECTRON spectroscopy, SYNCHROTRON radiation, LOW energy electron diffraction, ECONOMIC determinism

المؤلفون: Mannino, G., Whelan, S., Schroer, E., Privitera, V., Leveque, P., Svensson, B. G., Napolitani, E.

المصدر: Journal of Applied Physics; 5/15/2001, Vol. 89 Issue 10, p5381, 5p, 4 Graphs

مصطلحات موضوعية: SILICON, LOW energy electron diffraction, ELECTRIC transients, DIFFUSION

المؤلفون: Wei, Jian, Wang, Xue-sen, Bartelt, Norman C., Williams, Ellen D., Tung, R. T.

المصدر: Journal of Chemical Physics; 6/15/1991, Vol. 94 Issue 12, p8384, 6p

مصطلحات موضوعية: HIGH resolution spectroscopy, LOW energy electron diffraction, SCANNING tunneling microscopy, TRANSMISSION electron microscopy, SILICON

المؤلفون: Stuhlmann, Ch., Schmidt, J., Ibach, H.

المصدر: Journal of Applied Physics; 12/15/1992, Vol. 72 Issue 12, p5905, 7p, 2 Black and White Photographs, 1 Diagram, 1 Chart, 5 Graphs

مصطلحات موضوعية: THIN films, LOW energy electron diffraction, ELECTRON energy loss spectroscopy, ELECTRON diffraction, SILICON

المؤلفون: Jentzsch, F., Froitzheim, H., Theile, R.

المصدر: Journal of Applied Physics; 12/15/1989, Vol. 66 Issue 12, p5901, 7p

مصطلحات موضوعية: LOW energy electron diffraction, NICKEL, SILICON

المؤلفون: Griffiths, C. L., Macdonald, J. E., Williams, R. H.

المصدر: Journal of Applied Physics; 8/1/1991, Vol. 70 Issue 3, p1858, 3p

مصطلحات موضوعية: SILICON, LOW energy electron diffraction