-
1
المصدر: Surface and Interface Analysis. 44:1572-1581
مصطلحات موضوعية: Materials science, Silicon, Scanning electron microscope, Analytical chemistry, Energy-dispersive X-ray spectroscopy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, X-ray photoelectron spectroscopy, chemistry, Attenuated total reflection, Materials Chemistry, Organic chemistry, Surface layer, Fourier transform infrared spectroscopy, UV degradation
-
2
المؤلفون: Walter E. Byrd, Tinh Nguyen, Haiqing Hu, Li-Piin Sung, Cyril Clerici, Jonathan W. Martin, Debbie Stanley, Mounira Oudina, Bouchra Kidah, Xiaohong Gu, Jerry Y. C. Jean
المصدر: Journal of Coatings Technology and Research. 6:67-79
مصطلحات موضوعية: Materials science, business.industry, Surfaces and Interfaces, General Chemistry, Surface finish, engineering.material, Gloss (optics), Light scattering, Surfaces, Coatings and Films, Root mean square, Colloid and Surface Chemistry, Optics, Coating, Surface roughness, engineering, Specular reflection, Fourier transform infrared spectroscopy, Composite material, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1268f2f25c8970db341cf407b14506cf
https://doi.org/10.1007/s11998-008-9108-6