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1
المؤلفون: Takashi Noma, Atsuo Iida, Kazuhiro Takada, Hirokatsu Miyata
المصدر: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. :1021-1025
مصطلحات موضوعية: Diffraction, Physics, Nuclear and High Energy Physics, business.industry, Substrate (electronics), Microbeam, engineering.material, Synchrotron, law.invention, Rubbing, Optics, Coating, law, engineering, Thin film, Composite material, business, Instrumentation, Polyimide
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2
المؤلفون: Kenji Sakurai, Atsuo Iida
المصدر: Advances in X-ray Analysis. 39:695-700
مصطلحات موضوعية: Total internal reflection, Optics, Materials science, Interference (communication), business.industry, 010401 analytical chemistry, X-ray fluorescence, General Medicine, Thin film, 010403 inorganic & nuclear chemistry, business, 01 natural sciences, 0104 chemical sciences
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::82e6bb9b7be6a2ab91cc12a36a3fd3cf
https://doi.org/10.1154/s0376030800023132 -
3
المؤلفون: Takashi Noma, Atsuo Iida
المصدر: Review of Scientific Instruments. 65:837-844
مصطلحات موضوعية: Materials science, business.industry, X-ray, Synchrotron radiation, Microbeam, Synchrotron, law.invention, Optics, law, Thin film, business, Instrumentation, Intensity modulation, Image resolution, Intensity (heat transfer)
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4
المؤلفون: Atsuo Iida, Kenji Sakurai
المصدر: Advances in X-ray Analysis. 35:813-818
مصطلحات موضوعية: Materials science, business.industry, 010401 analytical chemistry, X-ray, General Medicine, 010403 inorganic & nuclear chemistry, 01 natural sciences, Layer thickness, 0104 chemical sciences, Optics, Interference (communication), Thin film, business, Incidence (geometry)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6a258c0e716fad6a62cb6d2b33f698b8
https://doi.org/10.1154/s037603080001301x -
5
المؤلفون: Takashi Noma, Atsuo Iida, Hirokatsu Miyata, Kazuhiro Takada
المصدر: Optical Interference Coatings.
مصطلحات موضوعية: Condensed Matter::Soft Condensed Matter, Diffraction, Crystallography, Materials science, Liquid crystal, Astrophysics::High Energy Astrophysical Phenomena, X-ray crystallography, Physics::Optics, X-ray optics, Synchrotron radiation, Thin film, Mesoporous material, Structural regularity
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a69617a30b56c64ce06763ad78c03a41
https://doi.org/10.1364/oic.2007.fa10 -
6
المؤلفون: Takashi Noma, Atsuo Iida, Kenji Sakurai
المصدر: Physical Review B. 48:17524-17526
مصطلحات موضوعية: Materials science, Oscillation, business.industry, Astrophysics::High Energy Astrophysical Phenomena, X-ray, Fluorescence, Molecular physics, Fluorescence intensity, Optics, Interference (communication), Transition metal, Angular dependence, Thin film, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ce2fdc7d43b41f31a5a76a807e68f76
https://doi.org/10.1103/physrevb.48.17524 -
7
المؤلفون: Takashi Noma, Atsuo Iida
المصدر: Journal of synchrotron radiation. 5(Pt 3)
مصطلحات موضوعية: Diffraction, Nuclear and High Energy Physics, Radiation, Materials science, Photon, business.industry, Microbeam, Refraction, Signal, law.invention, Optics, law, Thin film, business, Instrumentation, Image resolution, Monochromator
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8In-Plane Structural Analysis of CoCr Thin-Film Magnetic Media by Grazing Incidence X-Ray Diffraction
المؤلفون: Osamu Ishiwata, Atsuo Iida, Hideaki Teranish, Toyoji Ataka, Satoshi Komiya, Michio Ohsawa, Nobuyuki Takahashi, Takayuki Hirose
المصدر: Japanese Journal of Applied Physics. 38:365
مصطلحات موضوعية: Preferential alignment, Materials science, General Engineering, General Physics and Astronomy, Substrate (electronics), Sputter deposition, Condensed Matter::Materials Science, Magnetic anisotropy, Crystallography, Computer Science::Graphics, Sputtering, Computer Science::Computer Vision and Pattern Recognition, Crystallite, Texture (crystalline), Composite material, Thin film
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9
المؤلفون: Atsuo Iida, Kenji Sakurai
المصدر: Japanese Journal of Applied Physics. 31:L113
مصطلحات موضوعية: Chemistry, business.industry, General Engineering, General Physics and Astronomy, Synchrotron radiation, Surface finish, X-ray reflectivity, symbols.namesake, Fourier transform, Optics, Fourier analysis, Total external reflection, symbols, Specular reflection, Thin film, business
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10
المؤلفون: Norio Kato, Kazuya Saitoh, Chikara Hayashi, Konosuke Inagawa, Kazutake Kohra, Atsuo Iida
المصدر: Review of Scientific Instruments. 60:1519-1523
مصطلحات موضوعية: Materials science, business.industry, Phase (waves), Zone plate, Synchrotron, law.invention, Characterization (materials science), Optics, law, Sputtering, Focal Spot Size, Thin film, business, Instrumentation, Layer (electronics)