المؤلفون: Sun, L., Huang, X., Li, R., Choi, B., Xu, J.

المصدر: IEEE Transactions on Knowledge and Data Engineering IEEE Trans. Knowl. Data Eng. Knowledge and Data Engineering, IEEE Transactions on. 34(9):4313-4327 Sep, 2022

المؤلفون: Nam, K., Park, J., Choi, B., Kwon, K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(9):5289-5296 Sep, 2022

المؤلفون: Jang, J., Gwon, H., Kong, T., Yang, J., Choi, B.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 57(8):2462-2473 Aug, 2022

المؤلفون: Govindan, S., Kumar, A., Choi, B., Venkataraman, S., Gope, D.

المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 12(7):1204-1213 Jul, 2022

المؤلفون: Lee, B., Choi, B., Bang, H., Koh, Y.N., Han, K.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(13):12967-12975 Jul, 2022

المؤلفون: Nguyen, C.V., Cha, H., Bui, D., Choi, B.

المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 37(5):4952-4956 May, 2022

المؤلفون: Kim, J., Yoon, J., Choi, B.

المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 37(5):5763-5772 May, 2022

المؤلفون: Yi, P., Choi, B., Zhang, Z., Bhowmick, S.S., Xu, J.

المصدر: IEEE Transactions on Knowledge and Data Engineering IEEE Trans. Knowl. Data Eng. Knowledge and Data Engineering, IEEE Transactions on. 34(4):1788-1802 Apr, 2022

المؤلفون: Almalki, K.J., Jabbari, A., Ayinala, K., Sung, S., Choi, B., Song, S.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(7):7074-7083 Apr, 2022

المؤلفون: Li, G., Choi, B., Xu, J., Bhowmick, S.S., Chun, K., Wong, G.L.

المصدر: IEEE Transactions on Knowledge and Data Engineering IEEE Trans. Knowl. Data Eng. Knowledge and Data Engineering, IEEE Transactions on. 34(3):1149-1163 Mar, 2022