المؤلفون: Francis Leonard Deepak, Nicolas Reckinger, Wei Ou-Yang, Nitul S. Rajput, Geetanjali Deokar, Jean-François Colomer, Carla Bittencourt, Junjie Li, Mustapha Jouiad

المصدر: Deokar, G, Rajput, N, Lie, J, Deepak, F L, Ou-Yang, W, Reckinger, N, Bittencourt, C, Colomer, J-F & Jouiad, M 2018, ' Toward the use of CVD-grown MoS2 nanosheets as field-emission source ', Beilstein Journal of Nanotechnology, vol. 9, no. 1, pp. 1686-1694 . https://doi.org/10.3762/bjnano.9.160
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 1686-1694 (2018)

مصطلحات موضوعية: Materials science, Scanning electron microscope, Molybdenum disulfide (MoS ), General Physics and Astronomy, 02 engineering and technology, lcsh:Chemical technology, 010402 general chemistry, lcsh:Technology, 01 natural sciences, Field emission, symbols.namesake, X-ray photoelectron spectroscopy, Nanosheets, Microelectronics, lcsh:TP1-1185, General Materials Science, Electrical and Electronic Engineering, Transmission electron microscopy (TEM), lcsh:Science, Sulfurization, lcsh:T, business.industry, 021001 nanoscience & nanotechnology, Chemical vapor deposition (CVD), Isotropic etching, lcsh:QC1-999, 0104 chemical sciences, Field electron emission, Transmission electron microscopy, molybdenum disulfide (MoS2), symbols, Optoelectronics, lcsh:Q, 0210 nano-technology, Raman spectroscopy, business, Current density, lcsh:Physics

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94064358bf8d02d5e43223dbd00f275c
https://pure.unamur.be/ws/files/38609046/bjn9_Deokar_2018_p1686.pdf

المؤلفون: Geetanjali, Deokar, Nitul S, Rajput, Junjie, Li, Francis Leonard, Deepak, Wei, Ou-Yang, Nicolas, Reckinger, Carla, Bittencourt, Jean-Francois, Colomer, Mustapha, Jouiad

المصدر: Beilstein Journal of Nanotechnology

مصطلحات موضوعية: Nanoscience, nanosheets, sulfurization, chemical vapor deposition (CVD), field emission, molybdenum disulfide (MoS2), transmission electron microscopy (TEM), Nanotechnology, Full Research Paper

URL الوصول: https://explore.openaire.eu/search/publication?articleId=pmid________::a06efe11060ffac985535fbccccf0489
https://pubmed.ncbi.nlm.nih.gov/29977702

المؤلفون: Ahmad Bakaraki, Luc Henrard, Jean-Roch Huntzinger, Maxime Bayle, Matthieu Paillet, Jean-François Colomer, Ahmed Azmi Zahab, Alexandre Felten, Nicolas Reckinger, Jean-Louis Sauvajol, Perine Landois

المصدر: physica status solidi (b). 252:2375-2379

مصطلحات موضوعية: Materials science, Optical contrast, Graphene, business.industry, Analytical chemistry, Stacking, 02 engineering and technology, Chemical vapor deposition, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Exfoliation joint, Electronic, Optical and Magnetic Materials, law.invention, symbols.namesake, Few layer graphene, Optics, law, Orientation (geometry), 0103 physical sciences, symbols, 010306 general physics, 0210 nano-technology, Raman spectroscopy, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2511af2dd5b121d83747a5c816828a11
https://doi.org/10.1002/pssb.201552204

المؤلفون: Rony Snyders, Nicolas Reckinger, Belén Alemán, Carla Bittencourt, Jean-François Colomer, Theodosis Skaltsas, Matteo Amati, Luca Gregoratti, Nikos Tagmatarchis, Christopher P. Ewels, Pascal Pochet, Mattia Scardamaglia

المساهمون: Institut des Matériaux Jean Rouxel (IMN), Université de Nantes - UFR des Sciences et des Techniques (UN UFR ST), Université de Nantes (UN)-Université de Nantes (UN)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratory of Atomistic Simulation (LSIM ), Modélisation et Exploration des Matériaux (MEM), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Laboratoire de Chimie des Interactions Plasma Surface (CHIPS), Université de Mons-Hainaut, LISE, Facultés Universitaires Notre Dame de la Paix (FUNDP), Université de Nantes (UN)-Université de Nantes (UN)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC)-Ecole Polytechnique de l'Université de Nantes (EPUN), Université de Nantes (UN)-Université de Nantes (UN), Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])

المصدر: Carbon
Carbon, 2014, 73, pp.371-381. ⟨10.1016/j.carbon.2014.02.078⟩
Carbon, Elsevier, 2014, 73, pp.371-381. ⟨10.1016/j.carbon.2014.02.078⟩

مصطلحات موضوعية: Materials science, Graphene, Annealing (metallurgy), Inorganic chemistry, Doping, chemistry.chemical_element, 02 engineering and technology, General Chemistry, Chemical vapor deposition, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Nitrogen, 0104 chemical sciences, law.invention, Ion, Ion implantation, chemistry, law, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], General Materials Science, Irradiation, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::831b6c4a949de431fa25872424a3fd5f
https://researchportal.unamur.be/en/publications/14125a1f-996c-4f11-aaa7-e5629e8b3bd1

المؤلفون: Nicolas Reckinger, Frédéric Joucken, Stéphane Lucas, Anastasia V. Tyurnina, Jean-François Colomer, Eloise Van Hooijdonk

المصدر: Nano Research. 7:154-162

مصطلحات موضوعية: copper oxidation, Materials science, chemistry.chemical_element, Nanotechnology, Chemical vapor deposition, chemical vapor deposition, law.invention, atmospheric pressure, law, Microscopy, General Materials Science, Electrical and Electronic Engineering, Cu(111), Atmospheric pressure, Graphene, graphene, Moiré pattern, Condensed Matter Physics, Copper, Atomic and Molecular Physics, and Optics, chemistry, Chemical physics, scanning tunneling, microscopy, Scanning tunneling microscope, Graphene nanoribbons

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebc8b489007ef5fb025e786647eae69f
https://doi.org/10.1007/s12274-013-0382-y

المؤلفون: Jean-François Colomer, Jacques Ghijsen, Maria C. Asensio, Jérôme Lagoute, Chaoyu Chen, Frédéric Joucken, Stephane Lorcy, José Avila, Nicolas Reckinger, Robert Sporken

المصدر: Physical Review B. 93

مصطلحات موضوعية: Physics, Photoemission spectroscopy, Graphene, Angle-resolved photoemission spectroscopy, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Synchrotron, law.invention, law, 0103 physical sciences, High spatial resolution, Atomic physics, 010306 general physics, 0210 nano-technology, Electronic band structure, Image resolution

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0006b0c57ef94c037a36bc6c6ce277be
https://doi.org/10.1103/physrevb.93.241101

المؤلفون: Nicolas Reckinger, Emmanuel Dubois, D.A. Yarekha, Constantin Augustin Dutu, Sylvie Godey, Jean-Pierre Raskin, Xiaohui Tang, Jacek Ratajczak, J. Lacszcz, Laurianne Nougaret

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: Thin Solid Films
Thin Solid Films, Elsevier, 2012, 520, pp.4501-4505. ⟨10.1016/j.tsf.2012.02.076⟩
Thin Solid Films, 2012, 520, pp.4501-4505. ⟨10.1016/j.tsf.2012.02.076⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Fabrication, Annealing (metallurgy), Schottky barrier, Ultra-high vacuum, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, 01 natural sciences, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Erbium, X-ray photoelectron spectroscopy, chemistry, Transmission electron microscopy, 0103 physical sciences, Materials Chemistry, Thin film, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb4cc942e56d93f63a0c78889735ca95
https://researchportal.unamur.be/en/publications/27431f0c-ecaa-417a-b1d6-1b218da1544b

المؤلفون: Fritz Phillipp, E. Dupois, A. Łaszcz, J. Katcki, P. A. van Aken, Nicolas Reckinger, J. Ratajczak, A. Czerwinski

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: XIII International Conference on Electron Microscopy, EM'2008
XIII International Conference on Electron Microscopy, EM'2008, 2008, Cracow-Zakopane, Poland
Journal of Microscopy
Journal of Microscopy, Wiley, 2010, 237, pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩
Journal of Microscopy, 2010, 237, pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩

مصطلحات موضوعية: 010302 applied physics, Histology, Materials science, business.industry, Annealing (metallurgy), Schottky barrier, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, Atmospheric temperature range, 021001 nanoscience & nanotechnology, 01 natural sciences, Pathology and Forensic Medicine, Erbium, chemistry.chemical_compound, chemistry, Sputtering, Transmission electron microscopy, 0103 physical sciences, Silicide, Thermal, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eb316700dd1b9570dda140f834e88f92
https://doi.org/10.1111/j.1365-2818.2009.03264.x

المؤلفون: Xiaohui Tang, Nicolas Reckinger, Vincent Bayot, Christophe Krzeminski, Emmanuel Dubois

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Dispositifs Intégrés et Circuits Electroniques Machine Learning Group (DICE - MLG), Université Catholique de Louvain = Catholic University of Louvain (UCL), Contrat Européen, Université Catholique de Louvain-la-Neuve

المصدر: IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology, 2009, 8 (9), pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2009, 8 (9), pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩
IEEE Transactions on Nanotechnology, Institute of Electrical and Electronics Engineers, 2009, 8, pp.737-748. ⟨10.1109/TNANO.2009.2021653⟩

مصطلحات موضوعية: FOS: Computer and information sciences, Materials science, Nanowire, Computer Science - Emerging Technologies, FOS: Physical sciences, 02 engineering and technology, Integrated circuit, 01 natural sciences, scaling limits, Flash memory, non volatile memories, device scaling, law.invention, [PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], Memory cell, law, 0103 physical sciences, Electronic engineering, Process optimization, Electrical and Electronic Engineering, 010302 applied physics, Condensed Matter - Materials Science, business.industry, Materials Science (cond-mat.mtrl-sci), quantum dot, 021001 nanoscience & nanotechnology, Computer Science Applications, Non-volatile memory, Emerging Technologies (cs.ET), Nanoelectronics, Quantum dot, single-electron device, silicon on insulator technology (SOI), flash memories, Optoelectronics, 0210 nano-technology, business, Process modeling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2dd67207b42220606d9d328b18050943
https://researchportal.unamur.be/en/publications/37c2e85d-056e-48d8-9781-2ae2572b6832

المؤلفون: Guilhem Larrieu, Dmytro A. Yarekha, Emmanuel Dubois, Dominique Deresmes, Nicolas Breil, Nicolas Reckinger, Xiaohui Tang, Aomar Halimaoui

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: ECS Transactions
ECS Transactions, Electrochemical Society, Inc., 2009, 19, pp.201-207. ⟨10.1149/1.3117410⟩
ECS Transactions, 2009, 19, pp.201-207. ⟨10.1149/1.3117410⟩

مصطلحات موضوعية: 010302 applied physics, Ytterbium, Materials science, business.industry, Schottky barrier, Rare earth, chemistry.chemical_element, Silicon on insulator, 02 engineering and technology, Substrate (electronics), Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Erbium, chemistry.chemical_compound, chemistry, 0103 physical sciences, Silicide, Electronic engineering, Optoelectronics, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::acf5bc881c610a49cc55185ff8f378e5
https://doi.org/10.1149/1.3117410