المؤلفون: C. A. Duţu, Sorin Melinte, Jean-Pierre Raskin, Denis Flandre, Nicolas Reckinger, Alexandru Vlad

المصدر: Applied Physics Letters. 104:023502

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), Silicon, business.industry, Nanowire, chemistry.chemical_element, Subthreshold slope, chemistry.chemical_compound, chemistry, MOSFET, Triethoxysilane, Optoelectronics, Field-effect transistor, business, Silicon oxide, (3-Aminopropyl)triethoxysilane

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d2a9f7eeb0a4f1620e567000198f6896
https://doi.org/10.1063/1.4861598

المؤلفون: Thomas Walewyns, Jean-Pierre Raskin, Thomas Pardoen, Sophie Ryelandt, Nicolas Reckinger, Laurent Francis

المصدر: Journal of Micromechanics and Microengineering. 23:095021

مصطلحات موضوعية: Fabrication, Materials science, Mechanical Engineering, Nanowire, Nanotechnology, Electronic, Optical and Magnetic Materials, Surface micromachining, Mechanics of Materials, Etching (microfabrication), Chemical-mechanical planarization, Stiction, Electrical and Electronic Engineering, Layer (electronics), Polyimide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41e97aab8c370ff63cbbf3d5abac89bd
https://doi.org/10.1088/0960-1317/23/9/095021

المؤلفون: Vikram Passi, Nicolas Breil, Jean-Pierre Raskin, Emmanuel Dubois, A. Lecestre, Denis Flandre, D.A. Yarekha, Nicolas Reckinger, Xiaohui Tang, Guilhem Larrieu, Vincent Bayot, Jacek Ratajczak

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), UCL - FSA/ELEC - Département d'électricité

المصدر: Applied Physics Letters
Applied Physics Letters, 2009, 95, pp.023106-1-3. ⟨10.1063/1.3171929⟩
Applied Physics Letters, American Institute of Physics, 2009, 95, pp.023106-1-3. ⟨10.1063/1.3171929⟩
Applied Physics Letters, Vol. 95, no. 2 (2009)

مصطلحات موضوعية: 010302 applied physics, Materials science, nanotechnology, Physics and Astronomy (miscellaneous), business.industry, Nanowire, Electrical Evaluation, Nanotechnology, platinum alloys, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, 01 natural sciences, nanowires, silicon alloys, Transmission electron microscopy, transmission electron microscopy, 0103 physical sciences, Optoelectronics, Planar process, Wafer, 0210 nano-technology, business, Silicon nanowires, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9904a80b7d2eb969a9417e1f5de9a7de
https://doi.org/10.1063/1.3171929

المؤلفون: Xiaohui Tang, Christophe Krzeminski, Aurélien Lecavelier des Etangs-Levallois, Zhenkun Chen, Emmanuel Dubois, Erich Kasper, Alim Karmous, Nicolas Reckinger, Denis Flandre, Laurent A. Francis, Jean-Pierre Colinge, Jean-Pierre Raskin

المصدر: Nano Letters; Nov2011, Vol. 11 Issue 11, p4520-4526, 7p

المؤلفون: Xiaohui Tang, Jean-François Colomer, Luc Lajaunie, Emmanuel Dubois, Luc Henrard, Frédéric Joucken, Nicolas Reckinger, Benoît Hackens, Raul Arenal

المساهمون: University of Namur, Institute of Information and Communication Technologies, Electronics and Applied Mathematics (ICTEAM), Université Catholique de Louvain = Catholic University of Louvain (UCL), University of Zaragoza - Universidad de Zaragoza [Zaragoza], Laboratorio de Microscopías Avanzadas, LMA, Instituto de Nanociencia de Aragón, INA, Universidad de Zaragoza, ARAID Foundation, Zaragoza, 50018, Spain, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Microélectronique Silicium - IEMN (MICROELEC SI - IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), European UnionEuropean Commission [604391, 312483-ESTEEM2], EU H2020 ETN project 'Enabling Excellence' Grant [642742], Spanish Ministerio de Economia y Competitividad [FIS2013-46159-C3-3-P], Multi-Sensor-Platform for Smart Building Management project [611887], Actions de Recherche Concertees (ARC), Renatech Network, Microélectronique Silicium - IEMN (MICROE SI - IEMN)

المصدر: Nanoscale
Nanoscale, Royal Society of Chemistry, 2016, 8 (44), pp.18751-18759. ⟨10.1039/c6nr02936a⟩
Zaguán. Repositorio Digital de la Universidad de Zaragoza
instname

مصطلحات موضوعية: Materials science, Nucleation, chemistry.chemical_element, FOS: Physical sciences, 02 engineering and technology, Chemical vapor deposition, Abnormal grain growth, 010402 general chemistry, Epitaxy, 01 natural sciences, law.invention, [SPI]Engineering Sciences [physics], law, General Materials Science, Condensed Matter - Materials Science, Graphene, Recrystallization (metallurgy), Materials Science (cond-mat.mtrl-sci), 021001 nanoscience & nanotechnology, Copper, 3. Good health, 0104 chemical sciences, chemistry, Chemical engineering, Grain boundary, 0210 nano-technology

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::195f0fcbd616f554eb930e4150cd73f9

المؤلفون: Guoli Li, Nicolas André, Benjamin Huet, Thibault Delhaye, Nicolas Reckinger, Laurent A Francis, Lei Liao, Jean-Pierre Raskin, Yun Zeng, Denis Flandre

المصدر: Journal of Physics D: Applied Physics; 6/12/2019, Vol. 52 Issue 24, p1-1, 1p

مصطلحات موضوعية: ULTRAVIOLET detectors, MONOCHROMATIC light, FLEXIBLE electronics, WAVELENGTHS, MONOMOLECULAR films

المؤلفون: Jeroen E. Scheerder, Joris Van de Vondel, Luc Henrard, Alexandre Felten, Matthieu Paillet, Jean-François Colomer, Marcello Casa, Emile Haye, Nicolas Reckinger, Jean-Roch Huntzinger, Wout Keijers, Maria Sarno

المساهمون: Université de Namur [Namur] (UNamur), Università degli Studi di Salerno (UNISA), Laboratoire Charles Coulomb (L2C), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)

المصدر: University of Namur
Nanoscale
Nanoscale, Royal Society of Chemistry, 2019, 11 (11), pp.5094-5101. ⟨10.1039/c8nr09841g⟩
Reckinger, N, Casa, M, Scheerder, J E, Keijers, W, Paillet, M, Huntzinger, J-R, Haye, E, Felten, A, Vondel, J V D, Sarno, M, Henrard, L & Colomer, J-F 2018, ' Restoring self-limited growth of single-layer graphene on copper foil via backside coating ', ArXiv pre-print .

مصطلحات موضوعية: DYNAMICS, Technology, Chemistry, Multidisciplinary, Diffusion, CVD GROWTH, 02 engineering and technology, Chemical vapor deposition, Tungsten, 01 natural sciences, law.invention, Monocrystalline silicon, raman spectroscopy, Coating, chemical vapor deposition, law, General Materials Science, CRYSTAL GRAPHENE, Condensed Matter - Materials Science, Atmospheric pressure, Physics, HYDROGEN, 021001 nanoscience & nanotechnology, uniformity, cond-mat.mtrl-sci, Reproducibility, CU(111), Chemistry, Physical Sciences, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Science & Technology - Other Topics, Optoelectronics, Materials Science (all), 0210 nano-technology, CU, NUCLEATION, Materials science, SURFACE, Materials Science, FOS: Physical sciences, chemistry.chemical_element, Materials Science, Multidisciplinary, engineering.material, 010402 general chemistry, Physics, Applied, Nanoscience & Nanotechnology, [PHYS.COND.CM-MSQHE]Physics [physics]/Condensed Matter [cond-mat]/Mesoscopic Systems and Quantum Hall Effect [cond-mat.mes-hall], Science & Technology, business.industry, Graphene, Materials Science (cond-mat.mtrl-sci), Copper, 0104 chemical sciences, VAPOR-DEPOSITION GROWTH, HIGH-QUALITY, chemistry, copper, engineering, business

وصف الملف: Print; application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::68b15d4825f2308eb231c0369c29b60c
https://researchportal.unamur.be/en/publications/4a436c7e-6bce-4b9d-b1cb-d5abbd101388

المؤلفون: Michaël Lobet, Michael Sarrazin, francesca cecchet, Nicolas Reckinger, Alexandru Vlad, Jean-François Colomer, Dan Lis

المصدر: University of Namur

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d931ffaa883c91a1c5c01a6a2fda0488
https://researchportal.unamur.be/en/publications/cf81e2fb-33f5-486f-b29f-aad46b40203c

المؤلفون: Michaël Lobet, Matthieu Paillet, Luc Henrard, Nicolas Reckinger, Philippe Lambin, Mirko Cormann, Bruno Majérus

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Brewster's angle, Materials science, business.industry, Graphene, Optical polarization, 02 engineering and technology, Chemical vapor deposition, Dielectric, Substrate (electronics), 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, law.invention, Overlayer, symbols.namesake, law, symbols, Optoelectronics, 0210 nano-technology, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ddfddf8918f092e5b7fe309a10baa87c
http://www.scopus.com/inward/record.url?eid=2-s2.0-85052581602&partnerID=MN8TOARS

المؤلفون: Nazarov, A., Lysenko, V., Tang, X., Nicolas Reckinger, Bayot, V.

المصدر: Scopus-Elsevier

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5261a01e7901628c0560184491d5f0da
http://www.scopus.com/inward/record.url?eid=2-s2.0-79952598214&partnerID=MN8TOARS