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21
المؤلفون: Ridge A. Sibold, Zhigang Li, Michael Fox, Bo Bai, Shuo Mao, Hongzhou Xu, Wing Ng
المصدر: Journal of Turbomachinery. 144
مصطلحات موضوعية: Jet (fluid), Materials science, Mechanical Engineering, Heat transfer, Nozzle, Combustor, Mechanics, Combustion chamber, Transonic, Coolant, Vortex
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cc3748e3e0b003c9006fdf0a17f7f487
https://doi.org/10.1115/1.4052738 -
22
المؤلفون: Michael Fox, Jun Li, Shuo Mao, Zhigang Li, Bo Bai, Hongzhou Xu, Wing Ng
مصطلحات موضوعية: Materials science, Turbulence, business.industry, Rotational symmetry, Reynolds number, Geometry, Computational fluid dynamics, symbols.namesake, Mach number, Heat transfer, symbols, business, Transonic, Wind tunnel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f891cb2dbafd00193e97f1de08c44299
https://doi.org/10.1115/1.0002861v -
23
المؤلفون: Shuo Mao, Wing Ng, Stephen Lash, Michael Fox, Ridge A. Sibold, Hongzhou Xu
مصطلحات موضوعية: Jet (fluid), Materials science, Heat flux, business.industry, Turbulence, Heat transfer, Nozzle, Mechanics, Computational fluid dynamics, business, Transonic, Coolant
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::581b21364dc20f662a7039141f0caeae
https://doi.org/10.1115/1.0003117v -
24
المؤلفون: Shuo Mao, Hongzhou Xu, Jun Li, Wing Ng, Bo Bai, Michael Fox, Zhigang Li
مصطلحات موضوعية: Materials science, business.industry, Turbulence, Mechanical Engineering, Mechanics, Heat transfer coefficient, Computational fluid dynamics, Turbine, Coolant, symbols.namesake, Mach number, Heat transfer, symbols, business, Transonic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4afbb8985ed76d3bf7dc0e2d4ef83ad7
https://doi.org/10.1115/1.0002775v -
25
المؤلفون: Chengwen, Lu, Fangyu, Li, Xiaoxia, Yan, Shuo, Mao, Tiehua, Zhang
المصدر: Food Chemistry. 378:132032
مصطلحات موضوعية: Hydrolysis, beta-Glucosidase, Glycosides, Soybeans, General Medicine, Isoflavones, Food Science, Analytical Chemistry
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26
المؤلفون: W.S. Hung, Y.S. Cho, Chen Shuo-Mao, S.C. Hung, Y.-H. Lee, P.S. Chien
المصدر: IRPS
مصطلحات موضوعية: Stress (mechanics), Materials science, Reliability (semiconductor), Gate oxide, Logic gate, Hardware_INTEGRATEDCIRCUITS, Breakdown voltage, Time-dependent gate oxide breakdown, Hardware_PERFORMANCEANDRELIABILITY, Test method, Automotive engineering, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8507a898268e1076c5c00a4b08a3760e
https://doi.org/10.1109/irps46558.2021.9405144 -
27
المؤلفون: Hongzhou Xu, Michael Fox, Zhigang Li, Shuo Mao, Jun Li, Wing Ng, Luxuan Liu, Bo Bai
المصدر: Volume 7C: Heat Transfer.
مصطلحات موضوعية: Physics, symbols.namesake, Mach number, Turbulence, Turbulence kinetic energy, Heat transfer, symbols, Reynolds number, Heat transfer coefficient, Mechanics, Transonic, Freestream
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9eb3aa783264175a4a50b39ab3e2e02e
https://doi.org/10.1115/gt2020-14639 -
28
المؤلفون: Wing Ng, Michael Fox, Luke Luehr, Zhigang Li, Ridge A. Sibold, Hongzhou Xu, Shuo Mao
المصدر: Journal of Turbomachinery. 142
مصطلحات موضوعية: Flow visualization, Momentum (technical analysis), 020301 aerospace & aeronautics, Materials science, Turbulence, Mechanical Engineering, Nozzle, Flow (psychology), Mechanics, 02 engineering and technology, 01 natural sciences, 010305 fluids & plasmas, symbols.namesake, Mach number, 0203 mechanical engineering, Heat transfer, 0103 physical sciences, symbols, Transonic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a65fcaab87ae75e4d8bb47fea1a5d288
https://doi.org/10.1115/1.4047634 -
29
المؤلفون: Y. S. Tsai, Subhadeep Mukhopadhyay, D. S. Huang, J. H. Lee, I. K. Chen, Chen Shuo-Mao, Jun He, Ryan Lu
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Materials science, Dielectric strength, 020209 energy, Transistor, Time-dependent gate oxide breakdown, 02 engineering and technology, 01 natural sciences, Engineering physics, law.invention, law, Electric field, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Stress conditions, Current (fluid), Degradation (telecommunications), Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fab6ef0c793056359b2fd914faef6167
https://doi.org/10.1109/irps.2018.8353575 -
30
المؤلفون: Jen-Cheng Liu, Subhadeep Mukhopadhyay, Ryan Lu, Jun He, J. H. Lee, Y. F. Wang, Chen Shuo-Mao, Y.-H. Lee, Y. S. Tsai
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Voltage stability, Hardware_MEMORYSTRUCTURES, Key factors, Computer science, Driving current, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static noise margin, Hardware_PERFORMANCEANDRELIABILITY, Static random-access memory, Current source, Device failure, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::827109616dfab05c3737342d87679d67
https://doi.org/10.1109/iedm.2017.8268379