المؤلفون: Johnson, Michael R.

المصدر: 2018 IEEE AUTOTESTCON IEEE AUTOTESTCON, 2018. :1-5 Sep, 2018

Relation: 2018 IEEE AUTOTESTCON

المؤلفون: Yuanzhang Su, Xinfeng Guo, Hang Luo, Jingyuan Wang, Zhen Liu

المصدر: Applied Sciences, Vol 14, Iss 6, p 2410 (2024)

مصطلحات موضوعية: boundary scan test, generation of test vectors, heuristic search, fault detection, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999

الوصف: The generation of test vectors is a key technique that affects the efficiency and fault detection rate of the boundary scan test. Aiming at the local optimal solution problem of the current common test vectors generation algorithm, this paper proposes a test vectors generation algorithm based on improved GA-AO* model, through which the test vectors are generated by using the idea of heuristic search and backtracking correction. In order to speed up the heuristic search, this paper designed a heuristic function with both prior and posterior parameters to describe the influence of typical faults on the failure probability index of the test vectors. At the same time, this paper used a genetic algorithm (GA) to determine the specific values of the posterior parameters iteratively. Finally, through theoretical analysis and physical verification, compared with the test vector generated by the traditional method, the test vector generated by this method is optimized on the prior failure probability index and performs better in the physical experiment.

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2076-3417/14/6/2410; https://doaj.org/toc/2076-3417

URL الوصول: https://doaj.org/article/3322638b3975487bab31760352994aaf

المؤلفون: Ison, C., Spurrier, R., Somintac, M., Asuncion, R.

المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-4 Jul, 2018

Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Xingna, Hou, Jun, Ma, Shouhong, Chen

المصدر: 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2017 13th IEEE International Conference on. :384-387 Oct, 2017

Relation: 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Shuming, Du, Yan, Wang, Zijian, Cao

المصدر: 2016 IEEE AUTOTESTCON IEEE AUTOTESTCON, 2016. :1-7 Sep, 2016

Relation: 2016 IEEE AUTOTESTCON

المؤلفون: Tsai, Meng-Ting, Huang, Shi-Yu, Tsai, Kun-Han, Cheng, Wu-Tung

المصدر: 2015 IEEE International Test Conference (ITC) Test Conference (ITC), 2015 IEEE International. :1-9 Oct, 2015

Relation: 2015 IEEE International Test Conference (ITC)

المؤلفون: Chen Shouhong, Hou Xingna, Wang Zhuang, Yan Xuelong, Xu Chuanpei

المصدر: 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2015 12th IEEE International Conference on. 01:218-222 Jul, 2015

Relation: 2015 12th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Xiaopeng, Deng, Simao, Xu, Yong, Zhang

المصدر: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments Electronic Measurement & Instruments (ICEMI), 2013 IEEE 11th International Conference on. 1:264-270 Aug, 2013

Relation: 2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Huang, Chun-Ming, Yang, Chih-Chyau, Wu, Chien-Ming, Lin, Chih-Hsing, Chiu, Chun-Chieh, Liu, Yi-Jun, Chu, Chun-Chieh, Lin, Chun-Ping, Chien, Wei-De

المصدر: 2012 International Symposium on Intelligent Signal Processing and Communications Systems Intelligent Signal Processing and Communications Systems (ISPACS), 2012 International Symposium on. :802-805 Nov, 2012

Relation: 2012 International Symposium on Intelligent Signal Processing and Communications Systems (ISPACS 2012)

المؤلفون: Majeed, Mudassar, Ahlstrom, Daniel, Ingelsson, Urban, Carlsson, Gunnar, Larsson, Erik

المصدر: 2010 19th IEEE Asian Test Symposium Test Symposium (ATS), 2010 19th IEEE Asian. :159-162 Dec, 2010

Relation: 2010 19th Asian Test Symposium (ATS)