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1AN INVESTIGATION OF EFFECTIVE COMPRESSION RATIOS FOR THE PROPOSED SYNCHRONOUS DATA COMPRESSION PROTO
المؤلفون: R.R. Little
المصدر: Proceedings DCC '95 Data Compression Conference.
مصطلحات موضوعية: Communication industry, Information engineering, Computer engineering, Computer science, business.industry, Compression ratio, The Internet, business, Simulation, Data compression
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83f2a5e2cc9b64835ca59134d9ba4452
https://doi.org/10.1109/dcc.1995.515597 -
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المؤلفون: David Lorge Parnas
المصدر: CSEE&T
مصطلحات موضوعية: Engineering, business.industry, Field (computer science), Wonder, Computer engineering, Engineering education, ComputingMilieux_COMPUTERSANDEDUCATION, Engineering ethics, Undergraduate engineering, business, Software engineering, Electrical engineering technology, Curriculum, Pace
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7b8951381df85de4e6fb216f6b37a641
https://doi.org/10.1109/sedc.1997.592451 -
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المؤلفون: Daniel Stodolsky, Garth A. Gibson, Mark Holland
المصدر: Scopus-Elsevier
ISCAمصطلحات موضوعية: Standard RAID levels, Hardware_MEMORYSTRUCTURES, Transaction processing, business.industry, Computer science, Logging, Disk array, Workload, General Medicine, Computer engineering, Redundancy (engineering), Data_FILES, business, Parity (mathematics), Auxiliary memory, Computer hardware
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e258244875c5324be630ad5a293594b
https://doi.org/10.1109/isca.1993.698546 -
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المؤلفون: M.W. Maier
المصدر: Proceedings DCC '95 Data Compression Conference.
مصطلحات موضوعية: Communication industry, Computer engineering, Standardization, Computer science, business.industry, business, Throughput (business), Data compression, Computer network
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::65c4d3759d5aa1fee1815b8381750407
https://doi.org/10.1109/dcc.1995.515596 -
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المؤلفون: V.K. Agarwal, Janusz Rajski, A. Hassan, B.N. Dostie
المصدر: ITC
مصطلحات موضوعية: Engineering, Boundary scan, Computer engineering, business.industry, Test vector, Design for testing, Scan chain, Electronic engineering, Glue logic, Test compression, Automatic test pattern generation, business, Testability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::18736f66c8ead8a5b9755e8c55e317bb
https://doi.org/10.1109/test.1989.82358 -
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المؤلفون: Jeannie H. Panner, Robert Walter Bassett, J.G. Petrovick, S.L. Dingle, B.J. Butkus, Pamela S. Gillis, M.R. Faucher, Donald L. Wheater
المصدر: ITC
مصطلحات موضوعية: Programmable logic device, Digital electronics, Logic synthesis, Computer engineering, business.industry, Computer science, Logic family, Test compression, business, Resistor–transistor logic, Computer hardware, Logic optimization, Register-transfer level
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0e2fda7b8ae1d25994376cb6f803cf97
https://doi.org/10.1109/test.1989.82339 -
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المؤلفون: S.H. Duncan
المصدر: ITC
مصطلحات موضوعية: Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Emitter-coupled logic, Fault (power engineering), Reliability engineering, Controllability, Set (abstract data type), Test case, Computer engineering, Built-in self-test, Logic gate, Hardware_INTEGRATEDCIRCUITS, business, Design methods
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::265a4996c23a705b8b17801729abca7f
https://doi.org/10.1109/test.1989.82364 -
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المؤلفون: Fabrizio Lombardi, Y.-N. Shen
المصدر: ITC
مصطلحات موضوعية: Very-large-scale integration, Programmable logic device, Engineering, Logic synthesis, Computer engineering, business.industry, Logic family, Complex programmable logic device, business, Simple programmable logic device, Programmable logic array, Logic optimization
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2f04d85a84df821d61b554848a255933
https://doi.org/10.1109/test.1989.82354 -
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المؤلفون: M. Ben-Bassat, M. Klinger, J. Cheifetz, Israel Beniaminy, D. Ben-Arie
المصدر: ITC
مصطلحات موضوعية: Structure (mathematical logic), Engineering, business.industry, Troubleshooting, computer.software_genre, Expert system, Reliability engineering, Unit (housing), Automatic test equipment, Computer engineering, Test set, Benchmark (computing), business, computer, Multimeter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::49dbe5968c0c2aced3d3b885d666b028
https://doi.org/10.1109/test.1989.82280 -
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المؤلفون: T. Shimono, J. Kato, Masato Kawai
المصدر: Proceedings. 'Meeting the Tests of Time'., International Test Conference.
مصطلحات موضوعية: Very-large-scale integration, Engineering, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Fault (power engineering), Fault detection and isolation, Reliability engineering, Test (assessment), Stuck-at fault, Computer engineering, Test execution, Fault coverage, business, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::06a33149b433534334454016b657215a
https://doi.org/10.1109/test.1989.82392