يعرض 1 - 10 نتائج من 2,535 نتيجة بحث عن '"AgCl"', وقت الاستعلام: 1.03s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المصدر: IEEE Sensors Letters IEEE Sens. Lett. Sensors Letters, IEEE. 8(7):1-4 Jul, 2024

  2. 2
    دورية أكاديمية

    المؤلفون: Chen, G., Zhang, Q., He, H., Du, L., Lin, L., Zhang, W.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(10):16836-16844 May, 2024

  3. 3
    دورية أكاديمية

    المؤلفون: Wang, Y., Li, R., Song, X., Tong, J., Hou, T., Xin, Y.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-10 2024

  4. 4
    مؤتمر

    المصدر: 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) Flexible and Printable Sensors and Systems (FLEPS), 2023 IEEE International Conference on. :1-4 Jul, 2023

    Relation: 2023 IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS)

  5. 5
    دورية أكاديمية
  6. 6
    مؤتمر

    المصدر: 2023 IEEE 18th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) Nano/Micro Engineered and Molecular Systems (NEMS), 2023 IEEE 18th International Conference on. :74-77 May, 2023

    Relation: 2023 IEEE 18th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)

  7. 7
    دورية أكاديمية

    المؤلفون: Shen, C., Tang, W., Xi, X., Wu, D., Su, Y., Guo, X., Liu, R.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(15):16553-16561 Aug, 2023

  8. 8
    مؤتمر

    المصدر: 2022 2nd International Conference on Intelligent Cybernetics Technology & Applications (ICICyTA) Intelligent Cybernetics Technology & Applications (ICICyTA), 2022 2nd International Conference on. :186-191 Dec, 2022

    Relation: 2022 2nd International Conference on Intelligent Cybernetics Technology & Applications (ICICyTA)

  9. 9
  10. 10
    دورية أكاديمية

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-9 2023